Property engineering in BaTiO3 films by stoichiometry control
Ihlefeld, J.F., Daniels, P.R., Aygün, S.M., Borland, W.J., Maria, J-P.
Published in Journal of materials research (01.06.2010)
Published in Journal of materials research (01.06.2010)
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Journal Article
Contacts to silicon using a silver paste containing a phosphorus source
Ionkin, A S, Fish, B M, Zhigang Rick Li, Feng Gao, Lap Kin Cheng, Mikeska, K, Torardi, C, Lewittes, M, VerNooy, P, Ittel, S D, Liang, L, Getty, R, Roach, D H, Pepin, J G, Borland, W J
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
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Conference Proceeding
Characterization of Nonorthophosphate P 32 in Neutron-Irradiated Potassium Dihydrogen Phosphate
Borland, J. W., MacKenzie, A. J., Hill, W. L.
Published in Industrial and engineering chemistry (01.11.1952)
Published in Industrial and engineering chemistry (01.11.1952)
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Journal Article