Gevrey Regularity for the Attractor of the 3D Navier–Stokes–Voight Equations
Kalantarov, Varga K., Levant, Boris, Titi, Edriss S.
Published in Journal of nonlinear science (01.04.2009)
Published in Journal of nonlinear science (01.04.2009)
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Journal Article
Automatic Defect Segmentation by Unsupervised Anomaly Learning
Ofir, Nati, Yacobi, Ran, Granoviter, Omer, Levant, Boris, Shtalrid, Ore
Published in 2022 IEEE International Conference on Image Processing (ICIP) (16.10.2022)
Published in 2022 IEEE International Conference on Image Processing (ICIP) (16.10.2022)
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Conference Proceeding
Regularity of inviscid shell models of turbulence
Constantin, Peter, Levant, Boris, Titi, Edriss S
Published in Physical review. E, Statistical, nonlinear, and soft matter physics (01.01.2007)
Published in Physical review. E, Statistical, nonlinear, and soft matter physics (01.01.2007)
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Journal Article
Sharp Lower Bounds for the Dimension of the Global Attractor of the Sabra Shell Model of Turbulence
Constantin, Peter, Levant, Boris, Titi, Edriss S.
Published in Journal of statistical physics (01.06.2007)
Published in Journal of statistical physics (01.06.2007)
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Journal Article
Automatic defect segmentation by unsupervised anomaly learning
Ofir, Nati, Yacobi, Ran, Granoviter, Omer, Levant, Boris, Ore Shtalrid
Published in arXiv.org (21.06.2022)
Published in arXiv.org (21.06.2022)
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Paper
Journal Article
Statistical properties of nonlinear shell models of turbulence from linear advection models: rigorous results
Benzi, Roberto, Levant, Boris, Procaccia, Itamar, Titi, Edriss S
Published in Nonlinearity (01.06.2007)
Published in Nonlinearity (01.06.2007)
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Journal Article
IMAGE AUGMENTATION FOR MACHINE LEARNING BASED DEFECT EXAMINATION
YEMINY, Tomer, SHERMAN, Boris, YACOBY, Ran, RESHEF, Botser, LEVANT, Boris
Year of Publication 21.03.2024
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Year of Publication 21.03.2024
Patent
MACHINE LEARNING BASED EXAMINATION FOR PROCESS MONITORING
YOGEV, Shay, CHOONA, Lilach, SINITSA, Sergey, STURLESI, Boaz, ARIEL, Assaf, PRES, Shaul, TAL, Noam, LEVANT, Boris
Year of Publication 22.08.2024
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Year of Publication 22.08.2024
Patent
END-TO-END MEASUREMENT FOR SEMICONDUCTOR SPECIMENS
FRANK, Tal, DUBOVSKI, Bar, PELED, Tomer Haim, SKARIA, Bobin Mathew, TAL, Noam, LEVANT, Boris
Year of Publication 28.03.2024
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Year of Publication 28.03.2024
Patent
OPTIMAL DETERMINATION OF AN OVERLAY TARGET USING MACHINE LEARNING
HOUCHENS, Kevin Ryan, BOMSHTEIN, Nahum, PERRY, Jenny, DUBOVSKI, Bar, YACOBY, Ran, HSIEH, Tung-Yuan, LEVANT, Boris, ITZKOVICH, Tal
Year of Publication 29.08.2024
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Year of Publication 29.08.2024
Patent
MACHINE LEARNING BASED YIELD PREDICTION
YOGEV, Shay, CHOONA, Lilach, YACOBY, Ran, LINSHIZ, Jasmin Sonia, ARIEL, Assaf, PRES, Shaul, LEVANT, Boris, TAL, Noam
Year of Publication 22.08.2024
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Year of Publication 22.08.2024
Patent
Detecting a defective nozzle in a digital printing system
Yanir, Tomer, Siman Tov, Alon, Silberstein, Shai, Guttman, Avraham, Levant, Boris
Year of Publication 24.08.2023
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Year of Publication 24.08.2023
Patent
Method and system for optical metrology in patterned structures
Barak, Gilad, Machavariani, Vladimir, Hainick, Yanir, Koret, Roy, Levant, Boris
Year of Publication 01.09.2020
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Year of Publication 01.09.2020
Patent
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
LINDENFELD, ZE'EV, HAINICK, YANIR, SCHLEIFER, ELAD, BARAK, GILAD, LEVANT, BORIS, SHAFIROR, AMA, MICHAEL, FERBER, SMADAR, SHIRMAN, YURI
Year of Publication 08.12.2022
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Year of Publication 08.12.2022
Patent