Reliability Characteristics of TANOS (TaN/AlO/SiN/Oxide/Si)NAND Flash Memory with Rounded Corner (RC) Structure
Sung-Il Chang, Chang-Hyun Lee, Changseok Kang, Sanghun Jeon, Juhyung Kim, Byeong-In Choi, Youngwoo Park, Jintaek Park, Wonseok Jeong, Janghyun You, Bonghyun Choi, Jongsun Sel, Jae Sung Sim, Yoocheol Shin, Jungdal Choi, Won-Seong Lee
Published in 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design (01.05.2008)
Published in 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design (01.05.2008)
Get full text
Conference Proceeding
Semiconductor device
Jung, Euntaek, Choi, Bonghyun, Lee, Joonhee, Seo, Yujin, Lee, Byoungil, Lee, Seul, Takaki, Sejie, Jung, Changdae
Year of Publication 26.12.2023
Get full text
Year of Publication 26.12.2023
Patent
SEMICONDUCTOR DEVICE
Yujin Seo, Joonhee Lee, Bonghyun Choi, Euntaek Jung, Byoungil Lee, Sejie Takaki, Changdae Jung, Seul Lee
Year of Publication 30.12.2021
Get full text
Year of Publication 30.12.2021
Patent
Method and system for providing translation for conference assistance
Yoo, Doosun, Choi, Bonghyun, Kim, Jongwon, Kim, Jeongmin, Lee, Eunyoung, Shin, JoongHwi, Park, Min Sik, Choi, Hoon
Year of Publication 01.11.2022
Get full text
Year of Publication 01.11.2022
Patent