by Spinola, C., Vazquez, M.J.M., Bohorquez, A.F., Bonelo, J.M., Vizoso, J.
Published in IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188) (2001)

by Spinola, C., Galvez-Fernandez, C., Martin-Vazquez, M.J., Martin-Tapia, F.J., Bonelo, J.M., Vizoso, J., Munoz-Perez, J.
Published in 2008 IEEE International Conference on Industrial Technology (01.04.2008)

by Spinola, C.G., Bonelo, J.M., Canero, J.M., Espejo, S., Morilla, S., Luque, R.M., Martin-Vazquez, M.J., Garcia-Vacas, F., Galvez-Fernandez, C., Vizoso, J., Munoz-Perez, J.
Published in 2009 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (01.05.2009)

by Spinola, C., Gago, A., Bonelo, J.M., Vizoso, J.
Published in Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] (2000)

by Spinola, C., Galvez-Fernandez, C.J., Munoz-Perez, J., Jerrer, J., Bonelo, J.M., Vizoso, J.
Published in 2006 IEEE International Conference on Industrial Technology (01.12.2006)

by Spinola, C., Bonelo, J.M., Martin-Perez, C., Vizoso, J.
Published in Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) (2004)