Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction
Di Russo, E, Mavel, A, Fan Arcara, V, Damilano, B, Dimkou, I, Vézian, S, Grenier, A, Veillerot, M, Rochat, N, Feuillet, G, Bonef, B, Rigutti, L, Duboz, J-Y, Monroy, E, Cooper, D
Published in Nanotechnology (13.11.2020)
Published in Nanotechnology (13.11.2020)
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Interfacial chemistry in a ZnTe/CdSe superlattice studied by atom probe tomography and transmission electron microscopy strain measurements
BONEF, B., HAAS, B., ROUVIÈRE, J‐L., ANDRÉ, R., BOUGEROL, C., GRENIER, A., JOUNEAU, P‐H., ZUO, J‐M.
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Published in Journal of microscopy (Oxford) (01.05.2016)
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Atom probe tomography of nitride semiconductors
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Published in Scripta materialia (15.04.2018)
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Journal Article
Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction
Di Russo, E, Mavel, A, Fan Arcara, V, Damilano, B, Dimkou, Ioanna, Vézian, S, Grenier, A, Veillerot, M, Rochat, N, Feuillet, G, Bonef, B, Rigutti, L, Duboz, J-y, Monroy, E, Cooper, D
Published in Nanotechnology (13.11.2020)
Published in Nanotechnology (13.11.2020)
Get full text
Journal Article