Modification and reduction of defects in thin gate dielectric of MIS devices by injection-thermal and irradiation treatments
Andreev, Vladimir V., Bondarenko, Gennady G., Maslovsky, Vladimir M., Stolyarov, Alexander A., Andreev, Dmitry V.
Published in Physica status solidi. C (01.01.2015)
Published in Physica status solidi. C (01.01.2015)
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Journal Article
Programmable set to monitor charge state change of MIS devices under high-fields
Andreev, Dmitrii V., Bondarenko, Gennady G., Andreev, Vladimir V., Loskutov, Sergey A.
Published in 2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) (09.06.2022)
Published in 2022 Moscow Workshop on Electronic and Networking Technologies (MWENT) (09.06.2022)
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Conference Proceeding
Surface processes at the first stage of magnetron cathode Pd-Pd5Ba activation
Gaidar, Anna I., Bondarenko, Gennady G., Petrov, Vladimir S., Kashirina, Nelly V.
Published in Vacuum (01.08.2018)
Published in Vacuum (01.08.2018)
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Journal Article
Simulation of charge processes in dielectric films of MIS structures at simultaneous influence by ionization and high-field injection of electrons
Andreev, Dmitrii V., Bondarenko, Gennady G., Andreev, Vladimir V., Stolyarov, Alexander A.
Published in Procedia manufacturing (2019)
Published in Procedia manufacturing (2019)
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Journal Article
Automatized setup for researching of MIS structures under high-field tunnel injection of electrons at stress and measurement conditions
Andreev, Dmitrii V., Bondarenko, Gennady G., Andreev, Vladimir V., Stolyarov, Alexander A.
Published in 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT) (01.03.2018)
Published in 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT) (01.03.2018)
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Conference Proceeding