by Copetti, Thiago, Cardoso Medeiros, Guilherme, Taouil, Mottaqiallah, Hamdioui, Said, Bolzani Poehls, Letícia, Balen, Tiago
Published in Journal of electronic testing (01.06.2021)

by Cardoso Medeiros, Guilherme, Fieback, Moritz, Wu, Lizhou, Taouil, Mottaqiallah, Bolzani Poehls, Leticia Maria, Hamdioui, Said
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2021)

by Xun, Hanzhi, Fieback, Moritz, Yuan, Sicong, Aziza, Hassen, Heidekamp, Mathijs, Copetti, Thiago, Poehls, Leticia Bolzani, Taouil, Mottaqiallah, Hamdioui, Said
Published in 2023 IEEE 32nd Asian Test Symposium (ATS) (14.10.2023)

by Benfica, Juliano, Green, Bruno, Porcher, Bruno C., Bolzani Poehls, Leticia, Vargas, Fabian, Medina, Nilberto H., Added, Nemitala, de Aguiar, Vitor A. P., Macchione, Eduardo L. A., Aguirre, Fernando, Silveira, Marcilei A. G., Perez, Martin, Sofo Haro, Miguel, Sidelnik, Ivan, Blostein, Jeronimo, Lipovetzky, Jose, Bezerra, Eduardo A.
Published in IEEE transactions on nuclear science (01.04.2016)

by Jenihhin, Maksim, Squillero, Giovanni, Copetti, Thiago Santos, Tihhomirov, Valentin, Kostin, Sergei, Gaudesi, Marco, Vargas, Fabian, Raik, Jaan, Sonza Reorda, Matteo, Bolzani Poehls, Leticia, Ubar, Raimund, Medeiros, Guilherme Cardoso
Published in Journal of electronic testing (01.06.2016)

by Benfica, Juliano, Bolzani Poehls, Leticia M., Vargas, Fabian, Lipovetzky, José, Lutenberg, Ariel, Garcia, Sebastián E., Gatti, Edmundo, Hernandez, Fernando
Published in IEEE transactions on nuclear science (01.08.2012)

by Benfica, Juliano, Bolzani Poehls, Letícia Maria, Vargas, Fabian, Lipovetzky, José, Lutenberg, Ariel, Gatti, Edmundo, Hernandez, Fernando
Published in Journal of electronic testing (01.12.2012)

by Ubar, Raimund, Vargas, Fabian, Jenihhin, Maksim, Raik, Jaan, Kostin, Sergei, Bolzani Poehls, Leticia
Published in 2013 Euromicro Conference on Digital System Design (01.09.2013)

by Benfica, Juliano, Green, Bruno, Porcher, Bruno C., Bolzani Poehls, Leticia, Vargas, Fabian, Medina, Nilberto H., Added, Nemitala, de Aguiar, Vitor A. P., Macchione, Eduardo L. A., Aguirre, Fernando, da Silveira, Marcilei A. G.
Published in 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) (01.05.2016)

by Benfica, Juliano, Green, Bruno, Porcher, Bruno C., Bolzani Poehls, Leticia, Vargas, Fabian, Medina, Nilberto H., Added, Nemitala, de Aguiar, Vitor A. P., Macchione, Eduardo L. A., Aguirre, Fernando, da Silveira, Marcilei A. G., Bezerra, Eduardo A.
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)

by Pelke, Rebecca, Staudigl, Felix, Thomas, Niklas, Bosbach, Nils, Hossein, Mohammed, Cubero-Cascante, Jose, Poehls, Leticia Bolzani, Leupers, Rainer, Joseph, Jan Moritz
Published in 2024 IEEE 25th Latin American Test Symposium (LATS) (09.04.2024)

by Benfica, J., Bolzani Poehls, Leticia, Vargas, Fabian, Lipovetzky, J., Lutenberg, A., Garcia, S. E.
Published in 2012 Asia-Pacific Symposium on Electromagnetic Compatibility (01.05.2012)

by Kostin, Sergei, Raik, Jaan, Ubar, Raimund, Jenihhin, Maksim, Copetti, Thiago, Vargas, Fabian, Bolzani Poehls, Leticia
Published in 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (13.08.2015)

by Copetti, Thiago, Medeiros, Guilherme, Bolzani Poehls, Leticia, Vargas, Fabian, Kostin, Sergei, Jenihhin, Maksim, Raik, Jaan, Ubar, Raimund
Published in 2016 17th Latin-American Test Symposium (LATS) (01.04.2016)

Published in Journal of electronic testing (01.10.2022)

by Miryala, Sandeep, Calimera, Andrea, Macii, Enrico, Poncino, Massimo, Bolzani Poehls, Leticia
Published in 2013 14th Latin American Test Workshop - LATW (01.04.2013)

by Staudigl, Felix, Fetz, Thorben, Pelke, Rebecca, Sisejkovic, Dominik, Joseph, Jan Moritz, Bolzani Pohls, Leticia, Leupers, Rainer
Published in 2023 60th ACM/IEEE Design Automation Conference (DAC) (09.07.2023)

by Kostin, Sergei, Raik, Jaan, Ubar, Raimund, Jenihhin, Maksim, Vargas, Fabian, Bolzani Poehls, Leticia Maria, Copetti, Thiago Santos
Published in 2014 15th Latin American Test Workshop - LATW (01.03.2014)

by Miryala, Sandeep, Oleiro, Matheus, Bolzani Pöhls, Letícia Maria, Calimera, Andrea, Macii, Enrico, Poncino, Massimo
Published in Journal of electronic testing (01.06.2014)

by Pelke, Rebecca, Staudigl, Felix, Thomas, Niklas, Bosbach, Nils, Hossein, Mohammed, Cubero-Cascante, Jose, Poehls, Leticia Bolzani, Leupers, Rainer, Joseph, Jan Moritz
Year of Publication 20.03.2024