by Bolam, R.J., Ramachandran, V., Coolbaugh, D., Watson, K.M.
Published in IEEE transactions on electron devices (01.04.2003)

by Bolam, R.J., Ramachandran, V., Coolbaugh, D., Watson, K.M.
Published in IEEE transactions on electron devices (01.04.2003)

by Bolam, R.J, Ramachandran, V, Coolbaugh, D, Watson, K.M
Published in IEEE transactions on electron devices (01.04.2003)

by Shahidi, G.G., Ajmera, A., Assaderaghi, F., Bolam, R.J., Leobandung, E., Rausch, W., Sankus, D., Schepis, D., Wagner, L.F., Kun Wu, Davari, B.
Published in 1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278) (1999)

by Abadeer, W.W., Vollertsen, R.-P., Bolam, R.J., DiMaria, D.J., Cartier, E.
Published in Proceedings of 1994 VLSI Technology Symposium (1994)

by Shahidi, G.G., Ajmera, A., Assaderaghi, F., Bolam, R.J., Hovel, H., Leobandung, E., Rausch, W., Sadana, D., Schepis, D., Wagner, L.F., Wissel, L., Wu, K., Davari, B.
Published in Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327) (1999)

by Schepis, D.J., Assaderaghi, F., Yee, D.S., Rausch, W., Bolam, R.J., Ajmera, A.C., Leobandung, E., Kulkarni, S.B., Flaker, R., Sadana, D., Hovel, H.J., Kebede, T., Schiller, C., Wu, S., Wagner, L.F., Saccamango, M.J., Ratanaphanyarat, S., Kuang, J.B., Hsieh, M.C., Tallman, K.A., Martino, R.M., Fitzpatrick, D., Badami, D.A., Hakey, M., Chu, S.F., Davari, B., Shahidi, G.G.
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)

by Strong, A.W., Stamper, A.K., Bolam, R.J., Furukawa, T., Gow, C.J., Gow, T.R., Martin, D.W., Mittl, S.W., Nakos, J.S., Pennington, S.L.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)