Surge current capability of 6.5kV-rated SiC MOSFETs
Mihaila, A., Liu, C., Romano, G., Bianda, E., Wirths, S., Arango, Y., Knoll, L., Baschnagel, A., Boksteen, B.
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
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Conference Proceeding
Recent Progress in Silicon Devices for Ultra-High Power Applications
Vobecky, J., Vemulapati, U., Wikstrom, T., Boksteen, B., Dugal, F., Stiasny, T., Corvasce, C.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
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Conference Proceeding
6.5 kV field shielded anode (FSA) diode concept with 150C maximum operational temperature capability
Boksteen, B. K., Papadopoulos, C., Prindle, D., Kopta, A., Corvasce, C.
Published in 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2018)
Published in 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.05.2018)
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Conference Proceeding
Physics-based stability analysis of MOS transistors
Ferrara, A., Steeneken, P.G., Boksteen, B.K., Heringa, A., Scholten, A.J., Schmitz, J., Hueting, R.J.E.
Published in Solid-state electronics (01.11.2015)
Published in Solid-state electronics (01.11.2015)
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Journal Article
The safe operating volume as a general measure for the operating limits of LDMOS transistors
Ferrara, A., Steeneken, P. G., Heringa, A., Boksteen, B. K., Swanenberg, M., Scholten, A. J., van Dijk, L., Schmitz, J., Hueting, R. J. E.
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
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Conference Proceeding
Journal Article
The boost transistor: A field plate controlled LDMOST
Ferrara, A., Heringa, A., Boksteen, B. K., Claes, J., van der Wel, A., Schmitz, J., Hueting, R. J. E., Steeneken, P. G.
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
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Conference Proceeding
Design optimization of field-plate assisted RESURF devices
Boksteen, B. K., Ferrara, A., Heringa, A., Steeneken, P. G., Koops, G. E. J., Hueting, R. J. E.
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2013)
Published in 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2013)
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Conference Proceeding
Identifying failure mechanisms in LDMOS transistors by analytical stability analysis
Ferrara, A., Steeneken, P. G., Boksteen, B. K., Heringa, A., Scholten, A. J., Schmitz, J., Hueting, R. J. E.
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
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Conference Proceeding
Comparison of electrical techniques for temperature evaluation in power MOS transistors
Ferrara, A., Steeneken, P. G., Reimann, K., Heringa, A., Yan, L., Boksteen, B. K., Swanenberg, M., Koops, G. E. J., Scholten, A. J., Surdeanu, R., Schmitz, J., Hueting, R. J. E.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Extraction of the electric field in field plate assisted RESURF devices
Boksteen, B. K., Dhar, S., Heringa, A., Koops, G. E. J., Hueting, R. J. E.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
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Conference Proceeding
On the degradation of field-plate assisted RESURF power devices
Boksteen, B. K., Dhar, S., Ferrara, A., Heringa, A., Hueting, R. J. E., Koops, G. E. J., Salm, C., Schmitz, J.
Published in 2012 International Electron Devices Meeting (01.12.2012)
Published in 2012 International Electron Devices Meeting (01.12.2012)
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Conference Proceeding