X-Ray Study of the Superstructure in Heavily Doped Porous Indium Phosphide
Boiko, M. E., Sharkov, M. D., Karlina, L. B., Boiko, A. M., Konnikov, S. G.
Published in Semiconductors (Woodbury, N.Y.) (01.01.2018)
Published in Semiconductors (Woodbury, N.Y.) (01.01.2018)
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Journal Article
Investigation of microcrystalline silicon by the small-angle X-ray-scattering technique
Sharkov, M. D., Boiko, M. E., Boiko, A. M., Bobyl, A. V., Konnikov, S. G.
Published in Semiconductors (Woodbury, N.Y.) (01.08.2015)
Published in Semiconductors (Woodbury, N.Y.) (01.08.2015)
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Journal Article
X-ray studies of the domain formation in rocks under blasting
Sharkov, M. D., Boiko, M. E., Boiko, A. M., Borovikov, V. A., Grigor’ev, M. N., Konnikov, S. G.
Published in Physics of the solid state (01.11.2016)
Published in Physics of the solid state (01.11.2016)
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Journal Article
Domain structure of GaN/SiC-based materials for semiconductor lasers
Boiko, M. E., Sharkov, M. D., Boiko, A. M., Nesterov, S. I., Konnikov, S. G.
Published in Physics of the solid state (01.10.2013)
Published in Physics of the solid state (01.10.2013)
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Journal Article