SiC MOSFETs soft and hard failure modes: functional analysis and structural characterization
Richardeau, F., Boige, F., Castellazzi, A., Chazal, V., Fayyaz, A., Borghese, A., Irace, Andrea, Guibaud, G.
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
Published in 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.09.2020)
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Conference Proceeding
SiC power MOSFET in short-circuit operation: Electro-thermal macro-modelling combining physical and numerical approaches with circuit-type implementation
Boige, F., Richardeau, F., Lefebvre, S., Cousineau, M.
Published in Mathematics and computers in simulation (01.04.2019)
Published in Mathematics and computers in simulation (01.04.2019)
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Journal Article
Ensure an original and safe “fail-to-open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
Boige, F., Richardeau, F., Lefebvre, S., Blaquière, J.-M., Guibaud, G., Bourennane, A.
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article
Role of physiological state and cellular concentration on the survival of Azotobacter chroococcum exposed to gamma rays and ibenzmethyzine
Boige, F, Abbatucci, J S, Kauffmann, J, Goussard, J
Published in Comptes rendus des seances de la Societe de biologie et de ses filiales (1970)
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Published in Comptes rendus des seances de la Societe de biologie et de ses filiales (1970)
Journal Article