Structural analysis and resistivity measurements of InAs and GaSb fins on 300 mm Si for vertical (T)FET
Mols, Y., Bogdanowicz, J., Favia, P., Lagrain, P., Guo, W., Bender, H., Kunert, B.
Published in Journal of applied physics (28.06.2019)
Published in Journal of applied physics (28.06.2019)
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Journal Article
Measurement of the apex temperature of a nanoscale semiconducting field emitter illuminated by a femtosecond pulsed laser
Kumar, A., Bogdanowicz, J., Demeulemeester, J., Bran, J., Melkonyan, D., Fleischmann, C., Vandervorst, W.
Published in Journal of applied physics (28.12.2018)
Published in Journal of applied physics (28.12.2018)
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Journal Article
Atom probe tomography analysis of SiGe fins embedded in SiO2: Facts and artefacts
Melkonyan, D., Fleischmann, C., Arnoldi, L., Demeulemeester, J., Kumar, A., Bogdanowicz, J., Vurpillot, F., Vandervorst, W.
Published in Ultramicroscopy (01.08.2017)
Published in Ultramicroscopy (01.08.2017)
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Journal Article
Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation
Bogdanowicz, J., Kumar, A., Fleischmann, C., Gilbert, M., Houard, J., Vella, A., Vandervorst, W.
Published in Ultramicroscopy (01.05.2018)
Published in Ultramicroscopy (01.05.2018)
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Journal Article
On the understanding of local optical resonance in elongated dielectric particles
Bogdanowicz, J., Vandervorst, W.
Published in Journal of quantitative spectroscopy & radiative transfer (01.10.2014)
Published in Journal of quantitative spectroscopy & radiative transfer (01.10.2014)
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Journal Article
Wafer-scale characterization for two-dimensional material layers
Moussa, A., Bogdanowicz, J., Groven, B., Morin, P., Beggiato, M., Saib, M., Santoro, G., Abramovitz, Y., Houchens, K., Ben Nissim, S., Meir, N., Hung, J., Urbanowicz, A., Koret, R., Turovets, I., Lee, B., Lee, W.T., Lorusso, G. F., Charley, A.-L.
Published in Japanese Journal of Applied Physics (01.03.2024)
Published in Japanese Journal of Applied Physics (01.03.2024)
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Journal Article
Impact of the apex of an elongated dielectric tip upon its light absorption properties
Bogdanowicz, J., Gilbert, M., Koelling, S., Vandervorst, W.
Published in Applied surface science (30.05.2014)
Published in Applied surface science (30.05.2014)
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Journal Article
Conference Proceeding
Light absorption in conical silicon particles
Bogdanowicz, J, Gilbert, M, Innocenti, N, Koelling, S, Vanderheyden, B, Vandervorst, W
Published in Optics express (11.02.2013)
Published in Optics express (11.02.2013)
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Journal Article
Web Resource
On the interplay between relaxation, defect formation, and atomic Sn distribution in Ge(1−x)Sn(x) unraveled with atom probe tomography
Kumar, A., Demeulemeester, J., Bogdanowicz, J., Bran, J., Melkonyan, D., Fleischmann, C., Gencarelli, F., Shimura, Y., Wang, W., Loo, R., Vandervorst, W.
Published in Journal of applied physics (14.07.2015)
Published in Journal of applied physics (14.07.2015)
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Journal Article
Atom probe tomography analysis of SiGe fins embedded in SiO 2 : Facts and artefacts
Melkonyan, D, Fleischmann, C, Arnoldi, L, Demeulemeester, J, Kumar, A, Bogdanowicz, J, Vurpillot, F, Vandervorst, W
Published in Ultramicroscopy (01.08.2017)
Published in Ultramicroscopy (01.08.2017)
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Journal Article
Imaging of Overlay and Alignment Markers Under Opaque Layers Using Picosecond Laser Acoustic Measurements : AM: Advanced Metrology
Mehendale, M., Antonelli, A., Mair, R., Mukundhan, P., Bogdanowicz, J., Charley, A.L., Leray, P., Yasin, F., Crotti, D.
Published in 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (10.05.2021)
Published in 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (10.05.2021)
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Conference Proceeding
Optimal laser positioning for laser-assisted atom probe tomography
Koelling, S., Innocenti, N., Bogdanowicz, J., Vandervorst, W.
Published in Ultramicroscopy (01.09.2013)
Published in Ultramicroscopy (01.09.2013)
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Journal Article
Anisotropic stress in narrow sGe fin field-effect transistor channels measured using nano-focused Raman spectroscopy
Nuytten, T., Bogdanowicz, J., Witters, L., Eneman, G., Hantschel, T., Schulze, A., Favia, P., Bender, H., De Wolf, I., Vandervorst, W.
Published in APL materials (01.05.2018)
Published in APL materials (01.05.2018)
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Journal Article
Characterization of Sub-micron Metal Line Arrays Using Picosecond Ultrasonics
Mehendale, M., Kotelyanskii, M., Mair, R., Mukundhan, P., Bogdanowicz, J., Teugels, L., Charley, A.L., Kuszewski, P.
Published in 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.08.2020)
Published in 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.08.2020)
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Conference Proceeding
On the analysis of the activation mechanisms of sub-melt laser anneals
Clarysse, T., Bogdanowicz, J., Goossens, J., Moussa, A., Rosseel, E., Vandervorst, W., Petersen, D.H., Lin, R., Nielsen, P.F., Hansen, Ole, Merklin, G., Bennett, N.S., Cowern, N.E.B.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2008)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (05.12.2008)
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Journal Article
Non-destructive characterization of saw damage in silicon photovoltaics substrates by means of photomodulated optical reflectance
Bogdanowicz, J., Mertens, P. W., Cornagliotti, E., Wostyn, K., Penaud, J., Jaffrennou, P., Abric, E., Vandervorst, W.
Published in Physica status solidi. C (01.10.2012)
Published in Physica status solidi. C (01.10.2012)
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Journal Article
Subtelomeric rearrangements in Polish subjects with intellectual disability and dysmorphic features
Bogdanowicz, J., Pawłowska, B., Ilnicka, A., Gawlik-Zawiślak, S., Jóźwiak, A., Sobiczewska, B., Zdzienicka, E., Korniszewski, L., Zaremba, J.
Published in Journal of applied genetics (01.01.2010)
Published in Journal of applied genetics (01.01.2010)
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Journal Article
Inspection and metrology challenges for 3 nm node devices and beyond
Shohjoh, T., Ikota, M., Isawa, M., Lorusso, G. F., Horiguchi, N., Briggs, B., Mertens, H., Bogdanowicz, J., De Bisschop, P., Charley, A.-L.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)
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Conference Proceeding
Identification, characterization and purification of the lantibiotic staphylococcin T, a natural gallidermin variant
Furmanek, B., Kaczorowski, T., Bugalski, R., Bielawski, K., Bogdanowicz, J., Podhajska, AnD. A. J.
Published in Journal of applied microbiology (01.12.1999)
Published in Journal of applied microbiology (01.12.1999)
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Journal Article