by Theuwissen, A.J.P., Peek, H.L., van de Steeg, M.J.H., Boesten, R.M.G., Hartog, P.B., Kokshorn, A.L., De Koning, E.A., Oppers, J.M.A.M., Vledder, F.F., Centen, P.G.M., Blom, H., Haar, W.
Published in IEEE transactions on electron devices (01.09.1993)