Combined differential and common-mode scattering parameters: theory and simulation
Bockelman, D.E., Eisenstadt, W.R.
Published in IEEE transactions on microwave theory and techniques (01.07.1995)
Published in IEEE transactions on microwave theory and techniques (01.07.1995)
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Journal Article
Direct measurement of crosstalk between integrated differential circuits
Bockelman, D.E., Eisenstadt, W.R.
Published in IEEE transactions on microwave theory and techniques (01.08.2000)
Published in IEEE transactions on microwave theory and techniques (01.08.2000)
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Journal Article
Accuracy estimation of mixed-mode scattering parameter measurements
Bockelman, D.E., Eisenstadt, W.R., Stengel, R.
Published in IEEE transactions on microwave theory and techniques (01.01.1999)
Published in IEEE transactions on microwave theory and techniques (01.01.1999)
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Journal Article
Calibration and verification of the pure-mode vector network analyzer
Bockelman, D.E., Eisenstadt, W.R.
Published in IEEE transactions on microwave theory and techniques (01.07.1998)
Published in IEEE transactions on microwave theory and techniques (01.07.1998)
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Journal Article
Combined differential and common-mode analysis of power splitters and combiners
Bockelman, D.E., Eisenstadt, W.R.
Published in IEEE transactions on microwave theory and techniques (01.11.1995)
Published in IEEE transactions on microwave theory and techniques (01.11.1995)
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Journal Article
The SCC BJT: a high-performance bipolar transistor compatible with high-density deep-submicrometer BiCMOS SRAM technologies
Taft, R.C., Lage, C.S., Hayden, J.D., Kirsch, H.C., Lin, J.-H., Denning, D.J., Shapiro, F.B., Bockelman, D.E., Camilleri, N.
Published in IEEE transactions on electron devices (01.07.1995)
Published in IEEE transactions on electron devices (01.07.1995)
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Journal Article