NICA Beamlines and Stations for Applied Research
Filatov, G. A., Slivin, A. A., Syresin, E. M., Butenko, A. V, Vorozhtsov, A. S., Agapov, A. V., Shipulin, K. N., Kolesnikov, S. Yu, Galimov, A. R., Tikhomirov, A. M., Tyulkin, V. I., Donets, D. E., Letkin, D. S., Leushin, D. O., Tuzikov, A. V., Baldin, A. A., Korovkin, D. S., Timoshenko, G. N., Kulevoy, T. V., Titarenko, Y. E., Bobrovskiy, D. V., Chumakov, A. I., Soloviev, S. A., Kubankin, A. S., Firsov, D. G., Kubankin, Yu. S., Chernykh, P. N, Osipov, S. V., Serenkov, E. G., Chetverikov, S. A.
Published in Physics of particles and nuclei letters (01.08.2023)
Published in Physics of particles and nuclei letters (01.08.2023)
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Analysis of Metrological Provision Problems of a Test Stand for Testing Radio-Electronic Products for Resistance to Irradiation with High-Energy Heavy Ions
Butenko, A. V., Syresin, E. M., Tyutyunnikov, S. I., Batyaev, V. F., Kulevoy, T. V., Pavlov, K. V., Rogov, V. I., Titarenko, A. Yu, Titarenko, Yu. E., Berlyand, A. V., Berlyand, V. A., Sobolevskiy, N. M., Bobrovskiy, D. V., Chumakov, A. I., Saburov, V. O., Soloviev, A. N., Pesic, M. P.
Published in Physics of particles and nuclei letters (01.11.2019)
Published in Physics of particles and nuclei letters (01.11.2019)
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Journal Article
The Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation
Shvetsov-Shilovskiy, I. I., Chumakov, A. I., Pechenkin, A. A., Bobrovskiy, D. V.
Published in 2021 IEEE 32nd International Conference on Microelectronics (MIEL) (12.09.2021)
Published in 2021 IEEE 32nd International Conference on Microelectronics (MIEL) (12.09.2021)
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Conference Proceeding
Process Parameters Variations Influence on CMOS IC's Hardness to total Ionizing Dose
Moskovskaya, Y. M., Nikiforov, A. Y., Bobrovskiy, D. V., Ulanova, A. V., Zhukov, A. A.
Published in 2017 IEEE 30th International Conference on Microelectronics (MIEL) (01.10.2017)
Published in 2017 IEEE 30th International Conference on Microelectronics (MIEL) (01.10.2017)
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Conference Proceeding
System on module total ionizing dose distribution modeling
Akhmetov, A. O., Boychenko, D. V., Bobrovskiy, D. V., Chumakov, A. I., Kalashnikov, O. A., Nikiforov, A. Y., Nekrasov, P. V.
Published in 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 (01.05.2014)
Published in 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 (01.05.2014)
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Conference Proceeding