Body image and self-esteem in lower-limb amputees
Holzer, Lukas A, Sevelda, Florian, Fraberger, Georg, Bluder, Olivia, Kickinger, Wolfgang, Holzer, Gerold
Published in PloS one (24.03.2014)
Published in PloS one (24.03.2014)
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Journal Article
A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data
Schrunner, Stefan, Bluder, Olivia, Zernig, Anja, Kaestner, Andre, Kern, Roman
Published in 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA) (01.12.2018)
Published in 2018 17th IEEE International Conference on Machine Learning and Applications (ICMLA) (01.12.2018)
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Conference Proceeding
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability
Bluder, Olivia, Glavanovics, Michael, Pilz, Jürgen
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
Modeling fatigue life of power semiconductor devices with ε-N fields
Bluder, Olivia, Plankensteiner, Kathrin, Nelhiebel, Michael, Heinz, Walther, Leitner, Christian
Published in Proceedings of the Winter Simulation Conference 2014 (01.12.2014)
Published in Proceedings of the Winter Simulation Conference 2014 (01.12.2014)
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Conference Proceeding
Modeling and prediction of smart power semiconductor lifetime data using a Gaussian process prior
Plankensteiner, Kathrin, Bluder, Olivia, Pilz, Jurgen
Published in Proceedings of the Winter Simulation Conference 2014 (01.12.2014)
Published in Proceedings of the Winter Simulation Conference 2014 (01.12.2014)
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Conference Proceeding
Device level Maverick screening - detection of risk devices through Independent Component Analysis
Zernig, Anja, Bluder, Olivia, Pilz, Jurgen, Kastner, Andre
Published in Proceedings of the Winter Simulation Conference 2014 (01.12.2014)
Published in Proceedings of the Winter Simulation Conference 2014 (01.12.2014)
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Conference Proceeding
Markov random fields for pattern extraction in analog wafer test data
Schrunner, Stefan, Bluder, Olivia, Zernig, Anja, Kaestner, Andre, Kern, Roman
Published in 2017 Seventh International Conference on Image Processing Theory, Tools and Applications (IPTA) (01.11.2017)
Published in 2017 Seventh International Conference on Image Processing Theory, Tools and Applications (IPTA) (01.11.2017)
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Conference Proceeding
Optimal design of experiments for semiconductor lifetime data
Zernig, Anja, Bluder, Olivia, Spock, Gunter
Published in Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) (01.06.2013)
Published in Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) (01.06.2013)
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Conference Proceeding