Loss of heterozygosity and SOSTDC1 in adult and pediatric renal tumors
Blish, Kimberly R, Clausen, Kathryn A, Hawkins, Gregory A, Garvin, A Julian, Willingham, Mark C, Turner, Julie C, Torti, Frank M, Torti, Suzy V
Published in Journal of experimental & clinical cancer research (16.11.2010)
Published in Journal of experimental & clinical cancer research (16.11.2010)
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Journal Article
SOSTDC1 differentially modulates Smad and beta-catenin activation and is down-regulated in breast cancer
Clausen, Kathryn A., Blish, Kimberly R., Birse, Charles E., Triplette, Matthew A., Kute, Timothy E., Russell, Gregory B., D’Agostino, Ralph B., Miller, Lance D., Torti, Frank M., Torti, Suzy V.
Published in Breast cancer research and treatment (01.10.2011)
Published in Breast cancer research and treatment (01.10.2011)
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Journal Article
Stress modeling of Cu/low-k BEoL - application to stress migration
Zhai, C.J., Yao, H.W., Besser, P.R., Marathe, A., Blish, R.C., Erb, D., Hau-Riege, C., Taylor, S., Taylor, K.O.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
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Conference Proceeding
Dendrite fuse re-growth kinetics on organic substrates for microprocessors
Lambert, D., Gannamani, R., Blish, R.C.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)
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Conference Proceeding
Board level solder reliability versus ramp rate and dwell time during temperature cycling
Zhai, C.J., Sidharth, Blish, R.
Published in IEEE transactions on device and materials reliability (01.12.2003)
Published in IEEE transactions on device and materials reliability (01.12.2003)
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Magazine Article
Introduction to the Special Issue on Interface Reliability II
Blish, R., Christou, A., Samuelson, G., Thomas, B.
Published in IEEE transactions on device and materials reliability (01.06.2004)
Published in IEEE transactions on device and materials reliability (01.06.2004)
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Magazine Article
Fuse regrowth kinetics
Lambert, D., Gannamani, R., Blish, R.C.
Published in IEEE transactions on device and materials reliability (01.12.2004)
Published in IEEE transactions on device and materials reliability (01.12.2004)
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Magazine Article
Guest editorial special issue on interface reliability
Blish, R., Christou, A., Thomas, R., Samuelson, G.
Published in IEEE transactions on device and materials reliability (01.12.2003)
Published in IEEE transactions on device and materials reliability (01.12.2003)
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Magazine Article
Product-specific moisture levels: A conceptual framework
Blish, R.C., Sidharth
Published in IEEE transactions on device and materials reliability (01.03.2003)
Published in IEEE transactions on device and materials reliability (01.03.2003)
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Magazine Article
Investigation and minimization of underfill delamination in flip chip packages
Zhai, C.J., Sidharth, Blish, R.C., Master, R.N.
Published in IEEE transactions on device and materials reliability (01.03.2004)
Published in IEEE transactions on device and materials reliability (01.03.2004)
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Magazine Article
Flash memory under cosmic and alpha irradiation
Fogle, A.D., Don Darling, Blish, R.C., Daszko, E.
Published in IEEE transactions on device and materials reliability (01.09.2004)
Published in IEEE transactions on device and materials reliability (01.09.2004)
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Magazine Article
Simulation and experiments of stress migration for Cu/low-k BEoL
Zhai, C.J., Yao, H.W., Marathe, A.P., Besser, P.R., Blish, R.C.
Published in IEEE transactions on device and materials reliability (01.09.2004)
Published in IEEE transactions on device and materials reliability (01.09.2004)
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Magazine Article
Gold dendrite simulation: root cause determination
Kersey, J., Blish, R.C.
Published in IEEE transactions on device and materials reliability (01.06.2004)
Published in IEEE transactions on device and materials reliability (01.06.2004)
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Magazine Article