Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits
Wangyang Zhang, Xin Li, Liu, F., Acar, E., Rutenbar, R. A., Blanton, R. D.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2011)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2011)
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Journal Article
DFM Evaluation Using IC Diagnosis Data
Blanton, Ronald D. Shawn, Fa Wang, Cheng Xue, Nag, Pranab K., Yang Xue, Xin Li
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2017)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2017)
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Journal Article
Improving Diagnosis Through Failing Behavior Identification
Xiaochun Yu, Blanton, R. D.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2012)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2012)
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Journal Article
Partial co-training for virtual metrology
Cuong Nguyen, Xin Li, Blanton, Ronald D. Shawn, Xiang Li
Published in 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) (01.09.2017)
Published in 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) (01.09.2017)
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Conference Proceeding
Characterization of Locked Sequential Circuits via ATPG
Duvalsaint, Danielle, Liu, Zeye, Ravikumar, Ananya, Blanton, Ronald D.
Published in 2019 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2019)
Published in 2019 IEEE International Test Conference in Asia (ITC-Asia) (01.09.2019)
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Conference Proceeding
Improving Diagnostic Resolution of Failing ICs Through Learning
Xue, Yang, Li, Xin, Blanton, Ronald D.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2018)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2018)
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Journal Article
Ultra-low-power biomedical circuit design and optimization: Catching the don't cares
Li, Xin, Blanton, Ronald D., Grover, Pulkit, Thomas, Donald E.
Published in 2014 International Symposium on Integrated Circuits (ISIC) (01.12.2014)
Published in 2014 International Symposium on Integrated Circuits (ISIC) (01.12.2014)
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Conference Proceeding
Statistical learning in chip (SLIC)
Blanton, Ronald D., Xin Li, Ken Mai, Marculescu, Diana, Marculescu, Radu, Paramesh, Jeyanandh, Schneider, Jeff, Thomas, Donald E.
Published in 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2015)
Published in 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2015)
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Conference Proceeding
Back-End Layout Reflection for Test Chip Design
Liu, Zeye, Blanton, Ronald D.
Published in 2018 IEEE 36th International Conference on Computer Design (ICCD) (01.10.2018)
Published in 2018 IEEE 36th International Conference on Computer Design (ICCD) (01.10.2018)
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Conference Proceeding
Diagnostic resolution improvement through learning-guided physical failure analysis
Yang Xue, Xin Li, Blanton, Ronald D., Lim, Carlston, Amyeen, M. Enamul
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
CompactNet: High Accuracy Deep Neural Network Optimized for On-Chip Implementation
Goel, Abhinav, Liu, Zeye, Blanton, Ronald D.
Published in 2018 IEEE International Conference on Big Data (Big Data) (01.12.2018)
Published in 2018 IEEE International Conference on Big Data (Big Data) (01.12.2018)
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Conference Proceeding
Flexible, lightweight quantized deep neural networks
Blanton, Ronald D, Chin, Ting-Wu, Ding, Ruizhou, Liu, Zeye, Marculescu, Diana
Year of Publication 06.12.2022
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Year of Publication 06.12.2022
Patent
FLEXIBLE, LIGHTWEIGHT QUANTIZED DEEP NEURAL NETWORKS
Blanton, Ronald D, Chin, Ting-Wu, Ding, Ruizhou, Liu, Zeye, Marculescu, Diana
Year of Publication 03.12.2020
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Year of Publication 03.12.2020
Patent
Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits
Xin Li, Rutenbar, R.R., Blanton, R.D.
Published in 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers (01.11.2009)
Published in 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers (01.11.2009)
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Conference Proceeding