Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis
Fang, Chenlei, Huang, Qicheng, Blanton, R. D. Shawn
Published in 2021 IEEE 39th VLSI Test Symposium (VTS) (25.04.2021)
Published in 2021 IEEE 39th VLSI Test Symposium (VTS) (25.04.2021)
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Conference Proceeding
LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution
Huang, Qicheng, Fang, Chenlei, Shawn Blanton, R. D.
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Improving Test Chip Design Efficiency via Machine Learning
Liu, Zeye, Huang, Qicheng, Fang, Chenlei, Blanton, R. D.
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
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Conference Proceeding
Characterization of Locked Combinational Circuits via ATPG
Duvalsaint, Danielle, Jin, Xiaoxiao, Niewenhuis, Benjamin, Blanton, R. D.
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)
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Conference Proceeding
High Defect-Density Yield Learning using Three-Dimensional Logic Test Chips
Liu, Zeye, Shawn Blanton, R. D.
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
A Deterministic-Statistical Multiple-Defect Diagnosis Methodology
Mittal, Soumya, Shawn Blanton, R. D.
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
Published in 2020 IEEE 38th VLSI Test Symposium (VTS) (01.04.2020)
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Conference Proceeding
NOIDA: Noise-resistant Intra-cell Diagnosis
Mittal, Soumya, Blanton, R. D. Shawn
Published in 2018 IEEE 36th VLSI Test Symposium (VTS) (01.04.2018)
Published in 2018 IEEE 36th VLSI Test Symposium (VTS) (01.04.2018)
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Conference Proceeding
IPSA: Integer Programming via Sparse Approximation for Efficient Test-Chip Design
Huang, Qicheng, Fang, Chenlei, Liu, Zeye, Ding, Ruizhou, Blanton, R. D. Shawn
Published in 2019 IEEE 37th International Conference on Computer Design (ICCD) (01.11.2019)
Published in 2019 IEEE 37th International Conference on Computer Design (ICCD) (01.11.2019)
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Conference Proceeding
METER: Measuring Test Effectiveness Regionally
Yen-Tzu Lin, Blanton, R D
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2011)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2011)
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Journal Article
Achieving 100% cell-aware coverage by design
Zeye Liu, Niewenhuis, Ben, Mittal, Soumya, Blanton, R. D.
Published in 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2016)
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Published in 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2016)
Conference Proceeding
Journal Article
Systematic defect identification through layout snippet clustering
Wing Chiu Tam, Poku, O, Blanton, R D
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
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Conference Proceeding
Logic characterization vehicle design for yield learning
Niewenhuis, Ben, Dexter Liu, Zeye, Mittal, Soumya, Blanton, R. D. Shawn
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)
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Conference Proceeding
Journal Article
SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states
Niewenhuis, Ben, Blanton, R. D., Bhargava, Mudit, Ken Mai
Published in 2013 IEEE International Test Conference (ITC) (01.09.2013)
Published in 2013 IEEE International Test Conference (ITC) (01.09.2013)
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Conference Proceeding