Self-aligned normally-off metal-oxide-semiconductor n++GaN/InAlN/GaN high electron mobility transistors
Blaho, M., Gregušová, D., Haščík, Š., Jurkovič, M., Ťapajna, M., Fröhlich, K., Dérer, J., Carlin, J. -F., Grandjean, N., Kuzmík, J.
Published in Physica status solidi. A, Applications and materials science (01.05.2015)
Published in Physica status solidi. A, Applications and materials science (01.05.2015)
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Journal Article
horizontally polarizing liquid trap enhances the tabanid-capturing efficiency of the classic canopy trap
EGRI, Á, BLAHÓ, M, SZÁZ, D, KRISKA, G, MAJER, J, HERCZEG, T, GYURKOVSZKY, M, FARKAS, R, HORVÁTH, G
Published in Bulletin of entomological research (01.12.2013)
Published in Bulletin of entomological research (01.12.2013)
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Journal Article
Influence of oxygen-plasma treatment on AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors with HfO2 by atomic layer deposition: leakage current and density of states reduction
Stoklas, R, Gregušová, D, Blaho, M, Fröhlich, K, Novák, J, Matys, M, Yatabe, Z, Kordoš, P, Hashizume, T
Published in Semiconductor science and technology (24.03.2017)
Published in Semiconductor science and technology (24.03.2017)
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Journal Article
Technology of integrated self-aligned E/D-mode n++GaN/InAlN/AlN/GaN MOS HEMTs for mixed-signal electronics
Blaho, M, Gregušová, D, Haš ík, Š, Seifertová, A, apajna, M, Šoltýs, J, Šatka, A, Nagy, L, Chvála, A, Marek, J, Carlin, J-F, Grandjean, N, Konstantinidis, G, Kuzmík, J
Published in Semiconductor science and technology (01.06.2016)
Published in Semiconductor science and technology (01.06.2016)
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Journal Article
Pancreatic solid focal lesions: autoimmune pancreatitis or pancreatic cancer?
Kunovsky, L., Dite, P., Dolina, J., Kala, Z., Blaho, M., Dvorackova, J., Uvirova, M., Jabandziev, P., Janecek, P., Eid, M., Rohan, T., Maskova, H., Poredska, K., Vaculova, J., Trna, J.
Published in Pancreatology : official journal of the International Association of Pancreatology (IAP) ... [et al.] (01.11.2020)
Published in Pancreatology : official journal of the International Association of Pancreatology (IAP) ... [et al.] (01.11.2020)
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Journal Article
Moving current filaments in integrated DMOS transistors under short-duration current stress
Denison, M., Blaho, M., Rodin, P., Dubec, V., Pogany, D., Silber, D., Gornik, E., Stecher, M.
Published in IEEE transactions on electron devices (01.10.2004)
Published in IEEE transactions on electron devices (01.10.2004)
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Journal Article
Moving current filaments in integrated DMOS transistors under short-duration current stress
Denison, M., Blaho, M., Rodin, P., Dubec, V., Pogany, D., Silber, D., Gornik, E., Stecher, M.
Published in IEEE transactions on electron devices (01.08.2004)
Published in IEEE transactions on electron devices (01.08.2004)
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Journal Article
Automated setup for thermal imaging and electrical degradation study of power DMOS devices
Heer, M., Dubec, V., Blaho, M., Bychikhin, S., Pogany, D., Gornik, E., Denison, M., Stecher, M., Groos, G.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Journal Article
Conference Proceeding
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions
Blaho, M., Pogany, D., Zullino, L., Andreini, A., Gornik, E.
Published in Microelectronics and reliability (01.09.2002)
Published in Microelectronics and reliability (01.09.2002)
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Journal Article
Multiple-time-instant 2D thermal mapping during a single ESD event
DUBEC, V, BYCHIKHIN, S, BLAHO, M, HEER, M, POGANY, D, DENISON, M, JENSEN, N, STECHER, M, GROOS, G, GORNIK, E
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Journal Article
Conference Proceeding
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress
Dubec, V., Bychikhin, S., Blaho, M., Pogany, D., Gornik, E., Willemen, J., Qu, N., Wilkening, W., Zullino, L., Andreini, A.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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Journal Article
Technology and application of in-situ AlOx layers on III-V semiconductors
Kúdela, R., Šoltýs, J., Kučera, M., Stoklas, R., Gucmann, F., Blaho, M., Mičušík, M., Pohorelec, O., Gregor, M., Brytavskyi, I., Dobročka, E., Gregušová, D.
Published in Applied surface science (15.12.2018)
Published in Applied surface science (15.12.2018)
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Journal Article
Properties of InGaAs/GaAs metal-oxide-semiconductor heterostructure field-effect transistors modified by surface treatment
Gregušová, D., Gucmann, F., Kúdela, R., Mičušík, M., Stoklas, R., Válik, L., Greguš, J., Blaho, M., Kordoš, P.
Published in Applied surface science (15.02.2017)
Published in Applied surface science (15.02.2017)
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Journal Article
Influence of oxygen-plasma treatment on AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors with HfO 2 by atomic layer deposition: leakage current and density of states reduction
Stoklas, R, Gregušová, D, Blaho, M, Fröhlich, K, Novák, J, Matys, M, Yatabe, Z, Kordoš, P, Hashizume, T
Published in Semiconductor science and technology (01.04.2017)
Published in Semiconductor science and technology (01.04.2017)
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Journal Article
Schottky-barrier normally off GaN/InAlN/AlN/GaN HEMT with selectively etched access region
Jurkovic, M., Gregusova, D., Palankovski, V., Hascik, Stefan, Blaho, M., Cico, K., Frohlich, K., Carlin, J., Grandjean, N., Kuzmik, J.
Published in IEEE electron device letters (01.03.2013)
Published in IEEE electron device letters (01.03.2013)
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Journal Article
Internal behavior of BCD ESD protection devices under very-fast TLP stress
Blaho, M., Pogany, D., Gornik, E., Zullino, L., Morena, E., Stella, R., Andreini, A.
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)
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Conference Proceeding
Self-aligned normally-off metal-oxide-semiconductor n super(++)GaN/InAlN/GaN high electron mobility transistors
Blaho, M, Gregusova, D, Hascik, S, Jurkovic, M, apajna, M, Frohlich, K, Derer, J, Carlin, J-F, Grandjean, N, Kuzmik, J
Published in Physica status solidi. A, Applications and materials science (01.05.2015)
Published in Physica status solidi. A, Applications and materials science (01.05.2015)
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Journal Article
Backgating, high-current and breakdown characterisation of AlGaN/GaN HEMTs on silicon substrates
Kuzmik, J., Blaho, M., Pogany, D., Gornik, E., Alam, A., Dikme, Y., Heuken, M., Javorka, P., Marso, M., Kordos, P.
Published in ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003 (2003)
Published in ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003 (2003)
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Conference Proceeding