Memristor-Specific Failures: New Verification Methods and Emerging Test Problems
Biswas, Baishakhi Rani, Gupta, Sandeep
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Synthesizable 10-bit Stochastic TDC Using Common-Mode Time Dithering and Passive Approximate Adder with 0.012mm2 Active Area in 12nm FinFET
Zhang, Qiaochu, Su, Shiyu, Biswas, Baishakhi Rani, Gupta, Sandeep, Chen, Mike Shuo-Wei
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Development of Simulation Model of a Controlled Rectifier for Reactive Power Compensation
Biswas, Baishakhi Rani, Das, Ratul, Abedin, Md. Anwarul, Harun-Ur-Rashid, A.B.M.
Published in 2018 10th International Conference on Electrical and Computer Engineering (ICECE) (01.12.2018)
Published in 2018 10th International Conference on Electrical and Computer Engineering (ICECE) (01.12.2018)
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Conference Proceeding
A novel low buffered optimized Solid State Drive controller
Das, Ratul, Biswas, Baishakhi Rani, Harun-ur Rashid, A. B. M., Abedin, M. A.
Published in 2016 9th International Conference on Electrical and Computer Engineering (ICECE) (01.12.2016)
Published in 2016 9th International Conference on Electrical and Computer Engineering (ICECE) (01.12.2016)
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Conference Proceeding