Extracting Relevant Test Inputs from Bug Reports for Automatic Test Case Generation
Ouedraogo, Wendkuuni C., Plein, Laura, Kabore, Kader, Habib, Andrew, Klein, Jacques, Lo, David, Bissvande, Tegawende F.
Published in 2024 IEEE/ACM 46th International Conference on Software Engineering: Companion Proceedings (ICSE-Companion) (14.04.2024)
Published in 2024 IEEE/ACM 46th International Conference on Software Engineering: Companion Proceedings (ICSE-Companion) (14.04.2024)
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