Quantitative analysis of trace and major elements in thin sections of soils with the secondary ion microscope (Cameca)
Bisdom, E.B.A., Henstra, S., Werner, H.W., Boudewijn, P.R., Knippenberg, W.F., de Grefte, H.A.M., Gourgout, J.M., Migeon, H.N.
Published in Geoderma (01.01.1983)
Published in Geoderma (01.01.1983)
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Journal Article
review of the application of submicroscopic techniques in soil micromorphology. II. Electron microprobe analyzer (EMA), scanning electron microscope-energy dispersive X-ray analyzer (SEM-EDXRA), laser microprobe mass analyzer (LAMMA 500), electron spectroscopy for chemical analysis (ESCA), ion microprobe mass analyzer (IMMA), and the secondary ion micrscope (SIM)
Bisdom, E.B.A
Published in Submicroscopy of soils and weathered rocks : Submicroscopie du sol et des alterites (1981)
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Published in Submicroscopy of soils and weathered rocks : Submicroscopie du sol et des alterites (1981)
Conference Proceeding
review of the application of submicroscopic techniques in soil micromorphology. I. Transmission electron microscope (TEM) and scanning electron microscope (SEM)
Bisdom, E.B.A
Published in Submicroscopy of soils and weathered rocks : Submicroscopie du sol et des alterites (1981)
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Published in Submicroscopy of soils and weathered rocks : Submicroscopie du sol et des alterites (1981)
Conference Proceeding
Lehrbuch der Bodenkunde: (Textbook of Soil Science). F. Scheffer and P. Schachtschabel, 1989. 12th ed. Revised by P. Schachtschabel, H.-P. Blume, G. Brümmer, K.H. Hartge and U. Schwertmann. Ferdinand Enke Verlag, Stuttgart, 491 pp., 220 Fig., 103 Tables. Hardcover. Price DM 76.-ISBN 3-432-84772-6
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