Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography
Schmucker, S.W., Kumar, N., Abelson, J.R., Daly, S.R., Girolami, G.S., Bischof, M.R., Jaeger, D.L., Reidy, R.F., Gorman, B.P., Alexander, J., Ballard, J.B., Randall, J.N., Lyding, J.W.
Published in Nature communications (03.07.2012)
Published in Nature communications (03.07.2012)
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