Critical sensitivity of flash gate dimension spread on electrical performances for advanced embedded memory
Agharben, El Amine, Roussy, A., Bocquet, M., Bileci, M., Begouin, S., Marchadier, A.
Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
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Conference Proceeding
Nanocrystal Memory Cell Integration in a Stand-Alone 16-Mb nor Flash Device
Gerardi, C., Ancarani, V., Portoghese, R., Giuffrida, S., Bileci, M., Bimbo, G., Brafa, O., Mello, D., Ammendola, G., Tripiciano, E., Puglisi, R., Lombardo, S.A.
Published in IEEE transactions on electron devices (01.06.2007)
Published in IEEE transactions on electron devices (01.06.2007)
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Journal Article
Exclusion zone surrounding silicon nanoclusters formed by rapid thermal chemical vapour deposition on SiO2
PUGLISI, R. A, NICOTRA, G, LOMBARDO, S, SPINELLA, C, AMMENDOLA, G, BILECI, M, GERARDI, C
Published in Surface science (10.02.2004)
Published in Surface science (10.02.2004)
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Journal Article
Nanocrystal memories for FLASH device applications
Ammendola, Giuseppe, Ancarani, Valentina, Triolo, Virginia, Bileci, Marco, Corso, Domenico, Crupi, Isodiana, Perniola, Luca, Gerardi, Cosimo, Lombardo, Salvatore, DeSalvo, Barbara
Published in Solid-state electronics (01.09.2004)
Published in Solid-state electronics (01.09.2004)
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Journal Article
Nanocrystal Memory Cell Integration in a Stand-Alone 16-Mb @@inor@ Flash Device
Gerardi, C, Ancarani, V, Portoghese, R, Giuffrida, S, Bileci, M, Bimbo, G, Brafa, O, Mello, D, Ammendola, G, Tripiciano, E, Puglisi, R, Lombardo, S A
Published in IEEE transactions on electron devices (01.06.2007)
Published in IEEE transactions on electron devices (01.06.2007)
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Journal Article