Strong carrier freezeout above 77 K in tellurium-doped buried-channel MOS transistors
Tewksbury, S.K., Biazzo, M.R., Lindstrom, T.L.
Published in IEEE transactions on electron devices (01.01.1985)
Published in IEEE transactions on electron devices (01.01.1985)
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Journal Article
Chip Alignment Templates for Multichip Module Assembly
Tewksbury, S., Lindstrom, T., Hornak, L., Biazzo, M., Bosworth, R.
Published in IEEE transactions on components, hybrids, and manufacturing technology (01.03.1987)
Published in IEEE transactions on components, hybrids, and manufacturing technology (01.03.1987)
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Trennung und Bestimmung der unterphosphorigen Säure, phosphorigen Säure, Unterphosphorsäure und Phosphorsäure sowie ihrer Salze
Raquet, D., Pinte, P., Ionesco-Matiu, A., Popesco, A., Wolf, L., Jung, W., Probst, J., Hovorka, V., Njegovan, V., Marjanović, V., Perkowski, Z., Khoi, Tran Tron, Sanfourche, A., Blé, Fr, Focet, B., Moerk, F. X., Hughes, E. H., Chapman, H. D., Biazzo, R., Bougault, J., Cattelain, E., Kešans, A., Tschepelewetzki, M. L., Fiskina, R. A., Urbanek, L., King, E. J., Kitajima, S.
Published in Analytical and bioanalytical chemistry (01.07.1934)
Published in Analytical and bioanalytical chemistry (01.07.1934)
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