A self-sustaining Single Photon Avalanche Diode Model
Rink, S., Quenette, V., Manouvrier, J.R., Juge, A., Gouget, G., Rideau, D., Bianchi, R.A., Golanski, D., Mamdy, B., Kammerer, J.B., Uhring, W., Lallement, C., Pellegrini, S., Agnew, M., Rae, B.
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
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Conference Proceeding
Electrical analysis of mechanical stress induced by STI in short MOSFETs using externally applied stress
Gallon, C., Reimbold, G., Ghibaudo, G., Bianchi, R.A., Gwoziecki, R., Orain, S., Robilliart, E., Raynaud, C., Dansas, H.
Published in IEEE transactions on electron devices (01.08.2004)
Published in IEEE transactions on electron devices (01.08.2004)
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Journal Article
Electrical analysis of external mechanical stress effects in short channel MOSFETs on (0 0 1) silicon
Gallon, C., Reimbold, G., Ghibaudo, G., Bianchi, R.A., Gwoziecki, R.
Published in Solid-state electronics (01.04.2004)
Published in Solid-state electronics (01.04.2004)
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Journal Article
A new dynamic gate capacitance measurement protocol to evaluate integrated high-voltage devices' switching loss performances in power management applications
Grelu, C., Baboux, N., Bianchi, R.A., Plossu, C.
Published in IEEE transactions on electron devices (01.12.2005)
Published in IEEE transactions on electron devices (01.12.2005)
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Journal Article
Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs
Ioannidis, E.G., Dimitriadis, C.A., Haendler, S., Bianchi, R.A., Jomaah, J., Ghibaudo, G.
Published in Solid-state electronics (01.10.2012)
Published in Solid-state electronics (01.10.2012)
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Journal Article
Impact of Ge proportion on advanced SiGe bulk P-MOSFET matching performances
Rahhal, Lama, Bajolet, Aurélie, Cros, Antoine, Diouf, Cheikh, Kergomard, Flore, Rosa, Julien, Bidal, Gregory, Bianchi, Raul-Andres, Ghibaudo, Gérard
Published in Solid-state electronics (01.07.2013)
Published in Solid-state electronics (01.07.2013)
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Journal Article
Comparison of radio frequency physical vapor deposition target material used for LaOx cap layer deposition in 32nm NMOSFETs
Baudot, S., Caubet, P., Grégoire, M., Bianchi, R.A., Pantel, R., Zoll, S., Gros-Jean, M., Boujamaa, R., Normandon, P., Leroux, C., Ghibaudo, G.
Published in Microelectronic engineering (01.05.2011)
Published in Microelectronic engineering (01.05.2011)
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Journal Article
Comparison of radio frequency physical vapor deposition target material used for LaO x cap layer deposition in 32 nm NMOSFETs
Baudot, S., Caubet, P., Grégoire, M., Bianchi, R.A., Pantel, R., Zoll, S., Gros-Jean, M., Boujamaa, R., Normandon, P., Leroux, C., Ghibaudo, G.
Published in Microelectronic engineering (2011)
Published in Microelectronic engineering (2011)
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Journal Article
High voltage devices in advanced CMOS technologies
Bianchi, R.A., Raynaud, C., Blanchet, F., Monsieur, F., Noblanc, O.
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
Published in 2009 IEEE Custom Integrated Circuits Conference (01.09.2009)
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Conference Proceeding
CMOS-compatible temperature sensor with digital output for wide temperature range applications
Bianchi, R.A, Karam, J.M, Courtois, B, Nadal, R, Pressecq, F, Sifflet, S
Published in Microelectronics (01.10.2000)
Published in Microelectronics (01.10.2000)
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Journal Article
Hot-carrier reliability of 20V MOS transistors in 0.13 μm CMOS technology
Rey-Tauriac, Y., Badoc, J., Reynard, B., Bianchi, R.A., Lachenal, D., Bravaix, A.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Journal Article
Conference Proceeding
Low switching losses devices architectures for power management applications integrated in a low cost 0.13/spl mu/m CMOS technology
Grelu, C., Baboux, N., Bianchi, R.A., Plossu, C.
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
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Conference Proceeding
Switching loss optimization of 20V devices integrated in a 0.13 μm CMOS technology for portable applications
Grelu, C., Baboux, N., Bianchi, R.A., Plossu, C.
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)
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Conference Proceeding
CMOS compatible temperature sensor based on the lateral bipolar transistor for very wide temperature range applications
Bianchi, R.A., Santos, F. Vinci Dos, Karam, J.M., Courtois, B., Pressecq, F., Sifflet, S.
Published in Sensors and actuators. A, Physical (01.11.1998)
Published in Sensors and actuators. A, Physical (01.11.1998)
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Journal Article
Conference Proceeding
ALC crystal oscillators based pressure and temperature measurement integrated circuit for high temperature oil well applications
Bianchi, N.A., Karam, J.-M.M., Courtois, B.
Published in IEEE transactions on ultrasonics, ferroelectrics, and frequency control (01.09.2000)
Published in IEEE transactions on ultrasonics, ferroelectrics, and frequency control (01.09.2000)
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Journal Article
Conference Proceeding
High voltage devices integration into advanced CMOS technologies
Bianchi, R.A., Monsieur, F., Blanchet, F., Raynaud, C., Noblanc, O.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Conference Proceeding
Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors
Ioannidis, E. G., Haendler, S., Bajolet, A., Pahron, T., Planes, N., Arnaud, F., Bianchi, R. A., Haond, M., Golanski, D., Rosa, J., Fenouillet-Beranger, C., Perreau, P., Dimitriadis, C. A., Ghibaudo, G.
Published in 2011 International Electron Devices Meeting (01.12.2011)
Published in 2011 International Electron Devices Meeting (01.12.2011)
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Conference Proceeding
ALC crystal oscillator based pressure and temperature integrated measurement system for high temperature oil well applications
Bianchi, R.A., Karam, J.M., Courtois, B.
Published in Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the IEEE International Frequency Control Symposium (Cat. No.99CH36313) (1999)
Published in Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the IEEE International Frequency Control Symposium (Cat. No.99CH36313) (1999)
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Conference Proceeding