Well-Aligned Cone-Shaped Nanostructure of Polypyrrole/RuO2 and Its Electrochemical Supercapacitor
Zang, Jianfeng, Bao, Shu-Juan, Li, Chang Ming, Bian, Haijiao, Cui, Xiaoqiang, Bao, Qiaoliang, Sun, Chang Q, Guo, Jun, Lian, Keryn
Published in Journal of physical chemistry. C (25.09.2008)
Published in Journal of physical chemistry. C (25.09.2008)
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Journal Article
Metal nanorod-based metamaterials for beam splitting and a subdiffraction-limited dark hollow light cone
CHANGCHUN YAN, ZHANG, Dao Hua, DONGDONG LI, HAIJIAO BIAN, ZHENGJI XU, YUEKE WANG
Published in Journal of optics (2010) (01.08.2011)
Published in Journal of optics (2010) (01.08.2011)
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Journal Article
A general defect modelling and simulation-assisted approach for fault isolation in failure analysis
Li, Ang, Bian, Haijiao, Liu, Binghai, Li, Yao, Zhao, Yiqiang
Published in Microelectronics and reliability (01.12.2022)
Published in Microelectronics and reliability (01.12.2022)
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Journal Article
Electron emission of silicon field emitter arrays coated with N-doped SrTiO3 film
Chen, Xiaofeng, Lu, Hua, Bian, Haijiao, Zhu, Weiguang, Sun, Changqing, Tan, Ooi Kiang
Published in Journal of electroceramics (01.07.2006)
Published in Journal of electroceramics (01.07.2006)
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Conference Proceeding
Journal Article
Fault localization on Test Coverage and Functional Issue for SoC Product with Combining Bench and Pattern Test
Tian, Li, Xiao, Nan, Li, Ang, Zheng, Shijun, Bian, Haijiao, Yang, Jianli
Published in 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.07.2024)
Published in 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.07.2024)
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Conference Proceeding
Well-Aligned Cone-Shaped Nanostructure of Polypyrrole/RuO 2 and Its Electrochemical Supercapacitor
Zang, Jianfeng, Bao, Shu-Juan, Li, Chang Ming, Bian, Haijiao, Cui, Xiaoqiang, Bao, Qiaoliang, Sun, Chang Q., Guo, Jun, Lian, Keryn
Published in Journal of physical chemistry. C (25.09.2008)
Published in Journal of physical chemistry. C (25.09.2008)
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Journal Article
Case study on asymmetric Id measured on MOSFET
Bian, Haijiao, Li, Ang, Zheng, Shiiun
Published in 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (20.07.2020)
Published in 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (20.07.2020)
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Conference Proceeding