Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process
Mahatme, N. N., Jagannathan, S., Loveless, T. D., Massengill, L. W., Bhuva, B. L., Wen, S.-J, Wong, R.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node
Loveless, T D, Jagannathan, S, Reece, T, Chetia, J, Bhuva, B L, McCurdy, M W, Massengill, L W, Wen, S-J, Wong, R, Rennie, D
Published in IEEE transactions on nuclear science (01.06.2011)
Published in IEEE transactions on nuclear science (01.06.2011)
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Journal Article
Impact of Technology Scaling on SRAM Soft Error Rates
Chatterjee, I., Narasimham, B., Mahatme, N. N., Bhuva, B. L., Reed, R. A., Schrimpf, R. D., Wang, J. K., Vedula, N., Bartz, B., Monzel, C.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Technology Scaling Comparison of Flip-Flop Heavy-Ion Single-Event Upset Cross Sections
Gaspard, N. J., Jagannathan, S., Diggins, Z. J., King, M. P., Wen, S-J., Wong, R., Loveless, T. D., Lilja, K., Bounasser, M., Reece, T., Witulski, A. F., Holman, W. T., Bhuva, B. L., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Bias Dependence of Total-Dose Effects in Bulk FinFETs
Chatterjee, I., Zhang, E. X., Bhuva, B. L., Alles, M. A., Schrimpf, R. D., Fleetwood, D. M., Fang, Y.-P, Oates, A.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Empirical Modeling of FinFET SEU Cross Sections Across Supply Voltage
Harrington, R. C., Kauppila, J. S., Maharrey, J. A., Haeffner, T. D., Sternberg, A. L., Zhang, E. X., Ball, D. R., Nsengiyumva, P., Bhuva, B. L., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
Impact of Supply Voltage and Frequency on the Soft Error Rate of Logic Circuits
Mahatme, N. N., Gaspard, N. J., Jagannathan, S., Loveless, T. D., Bhuva, B. L., Robinson, W. H., Massengill, L. W., Wen, S.-J, Wong, R.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process
Ahlbin, J R, Gadlage, M J, Ball, D R, Witulski, A W, Bhuva, B L, Reed, R A, Vizkelethy, G, Massengill, L W
Published in IEEE transactions on nuclear science (01.12.2010)
Published in IEEE transactions on nuclear science (01.12.2010)
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Journal Article
Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology
Jagannathan, S., Loveless, T. D., Bhuva, B. L., Gaspard, N. J., Mahatme, N., Assis, T., Wen, S.-J, Wong, R., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
An Area Efficient Stacked Latch Design Tolerant to SEU in 28 nm FDSOI Technology
Wang, H.-B, Chen, L., Liu, R., Li, Y.-Q, Kauppila, J. S., Bhuva, B. L., Lilja, K., Wen, S.-J, Wong, R., Fung, R., Baeg, S.
Published in IEEE transactions on nuclear science (01.12.2016)
Published in IEEE transactions on nuclear science (01.12.2016)
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Journal Article
Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation Techniques
Maharrey, J. A., Kauppila, J. S., Harrington, R. C., Nsengiyumva, P., Ball, D. R., Haeffner, T. D., Zhang, E. X., Bhuva, B. L., Holman, W. T., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.01.2018)
Published in IEEE transactions on nuclear science (01.01.2018)
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Journal Article
On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology
Loveless, T. D., Kauppila, J. S., Jagannathan, S., Ball, D. R., Rowe, J. D., Gaspard, N. J., Atkinson, N. M., Blaine, R. W., Reece, T. R., Ahlbin, J. R., Haeffner, T. D., Alles, M. L., Holman, W. T., Bhuva, B. L., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Single-Event Tolerant Flip-Flop Design in 40-nm Bulk CMOS Technology
Jagannathan, S., Loveless, T. D., Bhuva, B. L., Wen, S., Wong, R., Sachdev, M., Rennie, D., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Single-Event Upset Characterization Across Temperature and Supply Voltage for a 20-nm Bulk Planar CMOS Technology
Kauppila, J. S., Kay, W. H., Haeffner, T. D., Rauch, D. L., Assis, T. R., Mahatme, N. N., Gaspard, N. J., Bhuva, B. L., Alles, M. L., Holman, W. T., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Effect of Device Variants in 32 nm and 45 nm SOI on SET Pulse Distributions
Maharrey, J. A., Quinn, R. C., Loveless, T. D., Kauppila, J. S., Jagannathan, S., Atkinson, N. M., Gaspard, N. J., Zhang, E. X., Alles, M. L., Bhuva, B. L., Holman, W. T., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect
Dodds, N. A., Hooten, N. C., Reed, R. A., Schrimpf, R. D., Warner, J. H., Roche, N. J., McMorrow, D., Wen, S., Wong, R., Salzman, J. F., Jordan, S., Pellish, J. A., Marshall, C. J., Gaspard, N. J., Bennett, W. G., Zhang, E. X., Bhuva, B. L.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
A Hardened-by-Design Technique for RF Digital Phase-Locked Loops
Loveless, T.D., Massengill, L.W., Bhuva, B.L., Holman, W.T., Witulski, A.F., Boulghassoul, Y.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Sensitivity of High-Frequency RF Circuits to Total Ionizing Dose Degradation
Jagannathan, S., Loveless, T. D., Zhang, E. X., Fleetwood, D. M., Schrimpf, R. D., Haeffner, T. D., Kauppila, J. S., Mahatme, N., Bhuva, B. L., Alles, M. L., Holman, W. T., Witulski, A. F., Massengill, L. W.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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