Silicon measurement, Debug & Root Cause Analysis for Crystal Oscillator Jitter degradation
Bhooshan, Rishi, Tiwari, Swapnil
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05.12.2023)
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05.12.2023)
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Conference Proceeding
Novel Power Grid Architecture To Reduce IR Drop And Prevent Electromagnetic Interference
Sharma, Ajay Kr, Bhooshan, Rishi, Imam, Raza
Published in 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC) (07.12.2022)
Published in 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC) (07.12.2022)
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Conference Proceeding
Novel Power Grid Design Architecture to Improve IR Voltage Drop and EMI Shield
Bhooshan, Rishi, Reber, Doug, Jain, Shreyans, Sharma, Ajay Kumar
Published in 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa) (20.05.2024)
Published in 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa) (20.05.2024)
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Conference Proceeding
Novel Pinout and Padring Architecture to Reduce Noise Coupling
Bhooshan, Rishi, Gupta, Pawan, Tiwari, Swapnil, Sharma, Ajay Kumar
Published in 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI) (29.07.2023)
Published in 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI) (29.07.2023)
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Conference Proceeding
Intra Die Super Power Pads Bonding for IR Voltage Drop Reduction in Automotive SoCs
Sharma, Ajay Kr, Bhooshan, Rishi, Kumari, Anchal, Jain, Shreyans
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05.12.2023)
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05.12.2023)
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Conference Proceeding
EMC Sensitivity Analysis of Crystal Oscillator through Direct Power Injection (DPI)
Sinha, Anand, Tripathi, Avinash, Wadhwa, Sanjay Kumar, Bhooshan, Rishi, Lippmann, Robert, Benlakhouy, Younes, Bansal, Sachin
Published in 2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) (09.03.2022)
Published in 2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) (09.03.2022)
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Conference Proceeding
Faraday cage for EMC improvement of electronic devices
Kumar, Shailesh, Bhooshan, Rishi, Varshney, Sumit, Verma, Chetan, Gideon, Lye
Published in 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) (01.12.2015)
Published in 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) (01.12.2015)
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Conference Proceeding
A new full-chip verification methodology to prevent CDM oxide failures
Etherton, Melanie, Ruth, Scott, Miller, James W., Agarwal, Rishabh, Bhooshan, Rishi, Ershov, Maxim, Cadjan, Meruzhan, Feinberg, Yuri, Srinivasan, Karthik, Chang, Norman, Youlin Liao
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
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Conference Proceeding