Minimization of parasitic capacitances in VMOS transistors
Bhatti, I.S., Rodgers, T.J., Edwards, J.R.
Published in 1976 International Electron Devices Meeting (1976)
Published in 1976 International Electron Devices Meeting (1976)
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Conference Proceeding
VMOS reliability
Edwards, J.R., Bhatti, I.S., Fuller, E.
Published in IEEE transactions on electron devices (01.01.1979)
Published in IEEE transactions on electron devices (01.01.1979)
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Journal Article