Testudo: Heavyweight security analysis via statistical sampling
Greathouse, Joseph L., Wagner, Ilya, Ramos, David A., Bhatnagar, Gautam, Austin, Todd, Bertacco, Valeria, Pettie, Seth
Published in 2008 41st IEEE/ACM International Symposium on Microarchitecture (08.11.2008)
Published in 2008 41st IEEE/ACM International Symposium on Microarchitecture (08.11.2008)
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