by Aitken, A, Beyer, G.P, Smith, S, Ritchie, D
Published in Radiotherapy and oncology (2014)

by Fillot, F., Tőkei, Zs, Beyer, G.P.
Published in Surface science (15.02.2007)

by Hoofman, R.J.O.M., Verheijden, G.J.A.M., Michelon, J., Iacopi, F., Travaly, Y., Baklanov, M.R., Tökei, Zs, Beyer, G.P.
Published in Microelectronic engineering (01.06.2005)

by Scarantino, C.W, Beyer, G.P, McCumber, L, Pursley, J
Published in International journal of radiation oncology, biology, physics (01.11.2007)

by Scarantino, C.W, Beyer, G.P, Coates, G.G, Rini, C
Published in International journal of radiation oncology, biology, physics (01.11.2007)

by Beyer, G.P., Mann, G.G., Pursley, J.A., Espenhahn, E.T., Fraisse, C., Godfrey, D.J., Oldham, M., Carrea, T.B., Bolick, N., Scarantino, C.W.
Published in IEEE sensors journal (01.01.2008)

by Travaly, Y., Beyer, G.P.
Published in Microelectronic engineering (01.11.2007)

by Afanas’ev, V.V., Keunen, K., Stesmans, A., Jivanescu, M., Tőkei, Zs, Baklanov, M.R., Beyer, G.P.
Published in Microelectronic engineering (01.07.2011)

by Vereecke, B., Pantouvaki, M., Ciofi, I., Beyer, G.P., Tökei, Zs
Published in Microelectronic engineering (01.05.2011)

by Scarantino, C., Prestidge, B., Anscher, M., Ferree, C., Black, R., Beyer, G.P.
Published in International journal of radiation oncology, biology, physics (01.11.2006)

by Volders, H., Carbonell, L., Heylen, N., Kellens, K., Zhao, C., Marrant, K., Faelens, G., Conard, T., Parmentier, B., Steenbergen, J., Peer, M. Van de, Wilson, C.J., Sleeckx, E., Beyer, G.P., Tőkei, Zs, Gravey, V., Shah, K., Cockburn, A.
Published in Microelectronic engineering (01.05.2011)

by Scarantino, C., Prestidge, B., Anscher, M., Ferree, C., Black, R., Beyer, G.P.
Published in International journal of radiation oncology, biology, physics (2006)

by Travaly, Y., Bamal, M., Carbonell, L., Iacopi, F., Stucchi, M., Van Hove, M., Beyer, G.P.
Published in Microelectronic engineering (01.11.2006)

by Croes, K., Wilson, C.J., Lofrano, M., Travaly, Y., De Roest, D., Tokei, Z., Beyer, G.P.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)

by Croes, K, Lofrano, M, Wilson, C J, Carbonell, L, Siew, Y K, Beyer, G P, Tokei, Z
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Wilson, C.J., Croes, K., Tokei, Z., Beyer, G.P., Horsfall, A.B., O'Neill, A.G.
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)

by Tökei, Zs, Li, Y.-L., Beyer, G.P.
Published in Microelectronics and reliability (01.09.2005)

by Bruynseraede, C., Tokei, Z., Iacopi, F., Beyer, G.P., Michelon, J., Maex, K.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Demuynck, S., Tokei, Z., Zhao, C., de Marneffe, J., Struyf, H., Boullart, W., de Beeck, M.O., Carbonell, L., Heylen, N., Vaes, J., Beyer, G.P., Vanhaelemeersch, S., Sadjadi, R., Zhu, H., Cirigliano, P., Kim, J.S., Vertommen, J., Coenegrachts, B., Pavel, E., Athayde, A.
Published in 2007 International Symposium on Semiconductor Manufacturing (01.10.2007)

by Tokei, Z., Sutcliffe, V., Demuynck, S., Iacopi, F., Roussel, P., Beyer, G.P., Hoofman, R.J.O.M., Maex, K.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)