by Hoofman, R.J.O.M., Verheijden, G.J.A.M., Michelon, J., Iacopi, F., Travaly, Y., Baklanov, M.R., Tökei, Zs, Beyer, G.P.
Published in Microelectronic engineering (01.06.2005)

by Fillot, F., Tőkei, Zs, Beyer, G.P.
Published in Surface science (15.02.2007)

by Vereecke, B., Pantouvaki, M., Ciofi, I., Beyer, G.P., Tökei, Zs
Published in Microelectronic engineering (01.05.2011)

by Volders, H., Carbonell, L., Heylen, N., Kellens, K., Zhao, C., Marrant, K., Faelens, G., Conard, T., Parmentier, B., Steenbergen, J., Peer, M. Van de, Wilson, C.J., Sleeckx, E., Beyer, G.P., Tőkei, Zs, Gravey, V., Shah, K., Cockburn, A.
Published in Microelectronic engineering (01.05.2011)

by Satta, A., Schuhmacher, J., Whelan, C. M., Vandervorst, W., Brongersma, S. H., Beyer, G. P., Maex, K., Vantomme, A., Viitanen, M. M., Brongersma, H. H., Besling, W. F. A.
Published in Journal of applied physics (15.12.2002)

by Wilson, C J, Croes, K, Van Cauwenberghe, M, Tőkei, Zs, Beyer, G P, Horsfall, A B, O'Neill, A G
Published in Semiconductor science and technology (01.11.2009)

by Travaly, Y., Bamal, M., Carbonell, L., Iacopi, F., Stucchi, M., Van Hove, M., Beyer, G.P.
Published in Microelectronic engineering (01.11.2006)

by Afanas’ev, V.V., Keunen, K., Stesmans, A., Jivanescu, M., Tőkei, Zs, Baklanov, M.R., Beyer, G.P.
Published in Microelectronic engineering (01.07.2011)

by Tökei, Zs, Li, Y.-L., Beyer, G.P.
Published in Microelectronics and reliability (01.09.2005)

by Tokei, Z., Sutcliffe, V., Demuynck, S., Iacopi, F., Roussel, P., Beyer, G.P., Hoofman, R.J.O.M., Maex, K.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Croes, K, Pantouvaki, M, Carbonell, L, Zhao, L, Beyer, G P, Tokei, Z
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by SATTA, Alessandra, SHAMIRYAN, Denis, BAKLANOV, Mikhail R, WHELAN, Caroline M, QUOC TOAN LE, BEYER, Gerald P, VANTOMME, André, MAEX, Karen
Published in Journal of the Electrochemical Society (01.05.2003)

by Croes, K, Wilson, C J, Lofrano, M, Vereecke, B, Beyer, G P, Tökei, Z
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)

by Croes, K, Lofrano, M, Wilson, C J, Carbonell, L, Siew, Y K, Beyer, G P, Tokei, Z
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Beyer, G P, Voorhoeve-den Hartog, H J
Published in Mycoses (01.03.1992)

by DULK, M. Den, VALENTIJN, R. M, WELTEN, C. A. H. C, BEYER, G. P. J
Published in Netherlands journal of medicine (01.10.2002)

by Bruynseraede, C., Tokei, Z., Iacopi, F., Beyer, G.P., Michelon, J., Maex, K.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Ciofi, I., Borrello, G., Madia, O., Wilson, C. J., Vereecke, B., Beyer, G. P.
Published in IEEE transactions on electron devices (01.06.2012)

by Tokei, Z., Van Aelst, J., Waldfried, C., Escorcia, O., Roussel, P., Richard, O., Travaly, Y., Beyer, G.P., Maex, K.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by van der Veen, Marleen H., Vereecke, Bart, Huyghebaert, Cedric, Cott, Daire J., Sugiura, Masahito, Kashiwagi, Yusaku, Teugels, Lieve, Caluwaerts, Rudy, Chiodarelli, Nicolò, Vereecken, Philippe M., Beyer, Gerald P., Heyns, Marc M., De Gendt, Stefan, Tökei, Zsolt
Published in Microelectronic engineering (01.06.2013)