A comprehensive study of the application of the EOP techniques on bipolar devices
Rebaï, M.M., Darracq, F., Guillet, J.-P., Bernou, E., Sanchez, K., Perdu, P., Lewis, D.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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