On-wafer testing of ICs using free-running optoelectronic sampling and capacitive coupling
Sargsjan, G., Hempel, K., Altmann, B., Bergner, H.
Published in Microelectronic engineering (01.09.1997)
Published in Microelectronic engineering (01.09.1997)
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Journal Article
Ultrafast processes in silicon studied by transient gratings
Bergner, H., Bruckner, V., Supianek, M.
Published in IEEE journal of quantum electronics (01.08.1986)
Published in IEEE journal of quantum electronics (01.08.1986)
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Journal Article
A time-resolved optical beam induced current method
Bergner, Harald, Damm, Tobias, Stamm, Uwe, Stolberg, Klaus-Peter
Published in Microelectronic engineering (1990)
Published in Microelectronic engineering (1990)
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Journal Article
Detecting lateral temp. distribution in semiconductor element - using laser-raster microscope with OBIC stage and laser with wavelength near absorption edge of semiconductor material
KRAUSE, AXEL, O-1197 BERLIN, DE, BERGNER, HARALD., O-6900 JENA, DE, STAMM, UWE., O-6902 JENA, DE
Year of Publication 05.12.1991
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Year of Publication 05.12.1991
Patent
ANORDNUNG ZUR KONDENSATUEBERWACHUNG AUF OELEINBRUECHE
BERGNER,HARALD,DD, SCHOENFELD,MARTIN,DD, ENGERT,LIANE,DD, ZIPPEL,EDUARD,DD, NAUMANN,HARALD,DD
Year of Publication 25.01.1984
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Year of Publication 25.01.1984
Patent