X-CHIP-03: SOI MAPS radiation sensor with hit-counting and ADC mode
Havranek, Miroslav, Benka, Tomas, Hejtmanek, Martin, Janoska, Zdenko, Lednicky, Denis, Kafka, Vladimir, Marcisovska, Maria, Marcisovsky, Michal, Neue, Gordon, Svihra, Peter, Tomasek, Lukas, Vancura, Pavel, Vrba, Vaclav
Published in 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC) (01.11.2018)
Published in 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC) (01.11.2018)
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Conference Proceeding
A study of single event effects induced by heavy charged particles in 180 nm SoI technology
Marcisovska, Maria, Benka, Tomas, Finger, Miroslav, Havranek, Miroslav, Hejtmanek, Martin, Janoska, Zdenko, Kabatova, Anezka, Kafka, Vladimir, Marcisovsky, Michal, Mitrofanov, Semen V., Neue, Gordon, Popule, Jiri, Skuratov, Vladimir A., Suchanek, Petr, Svihra, Peter, Tomasek, Lukas, Vaculciak, Matej, Vancura, Pavel, Vrba, Vaclav
Published in 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC) (01.11.2018)
Published in 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC) (01.11.2018)
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Conference Proceeding
Dose rate measuring device
Marčišovská, Mária, Vančura, Pavel, Havránek, Miroslav, Marčišovský, Michal, Vrba, Václav, Semmler, Milan, Gečnuk, Josef, Tomášek, Lukáš, Neue, Gordon, Benka, Tomáš, Janoška, Zdenko, Kafka, Vladimír
Year of Publication 25.02.2020
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Year of Publication 25.02.2020
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