Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices
Staudt, Hans Martin von, Benhebibi, Mohamed Anas, Rearick, Jeff, Laisne, Michael
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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