Modern Trends in Microelectronics Packaging Reliability Testing
Bender, Emmanuel, Bernstein, Joseph B, Boning, Duane S
Published in Micromachines (Basel) (15.03.2024)
Published in Micromachines (Basel) (15.03.2024)
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Journal Article
Simplified algorithm for assessment equivalent circuit parameters of induction motors
Rajput, Shailendra, Bender, Emmanuel, Averbukh, Moshe
Published in IET electric power applications (01.03.2020)
Published in IET electric power applications (01.03.2020)
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Journal Article
Reliability prediction with MTOL
Bernstein, Joseph B., Bensoussan, Alain, Bender, Emmanuel
Published in Microelectronics and reliability (01.01.2017)
Published in Microelectronics and reliability (01.01.2017)
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Journal Article
Open Archive TOULOUSE Archive Ouverte (OATAO) Reliability prediction with MTOL
Bernstein, Joseph B, Bensoussan, Alain, Bender, Emmanuel, Bernstein, Joseph B
Published in Microelectronics and reliability (01.01.2017)
Published in Microelectronics and reliability (01.01.2017)
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Journal Article
Mitigation of Thermal Stability Concerns in FinFET Devices
Bender, Emmanuel, Bernstein, Joseph B., Boning, Duane S.
Published in Electronics (Basel) (01.10.2022)
Published in Electronics (Basel) (01.10.2022)
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Journal Article