Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment
Tajalli, Alaleh, Borga, Matteo, Meneghini, Matteo, De Santi, Carlo, Benazzi, Davide, Besendörfer, Sven, Püsche, Roland, Derluyn, Joff, Degroote, Stefan, Germain, Marianne, Kabouche, Riad, Abid, Idriss, Meissner, Elke, Zanoni, Enrico, Medjdoub, Farid, Meneghesso, Gaudenzio
Published in Micromachines (Basel) (17.01.2020)
Published in Micromachines (Basel) (17.01.2020)
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Journal Article
Buffer breakdown in GaN-on-Si HEMTs: A comprehensive study based on a sequential growth experiment
Borga, M., Meneghini, M., Benazzi, D., Canato, E., Püsche, R., Derluyn, J., Abid, I., Medjdoub, F., Meneghesso, G., Zanoni, E.
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
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Journal Article