Characterization of recombination centers in Si epilayers after He implantation by direct measurement of local lifetime distribution with the AC lifetime profiling technique
Spirito, P., Daliento, S., Sanseverino, A., Gialanella, L., Romano, M., Limata, B.N., Carta, R., Bellemo, L.
Published in IEEE electron device letters (01.09.2004)
Published in IEEE electron device letters (01.09.2004)
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Journal Article
Electrical measurement of the lattice damage induced by α -particle implantation in silicon
Bellemo, L., Carta, R., Daliento, S., Gialanella, L., Limata, B.N., Mele, L., Romano, M., Sanseverino, A., Spirito, P.
Published in Vacuum (30.05.2005)
Published in Vacuum (30.05.2005)
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Journal Article
200V Fast Recovery Epitaxial Diode with superior ESD capability
Irace, A., Maresca, L., Mirone, P., Riccio, M., Breglio, G., Bellemo, L., Carta, R., Naretto, M., El Baradai, N., Para, I., Di Santo, N.
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
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Journal Article
Physics-based mixed-mode reverse recovery modeling and optimization of Si PiN and MPS fast recovery diodes
Cappelluti, F., Bonani, F., Furno, M., Ghione, G., Carta, R., Bellemo, L., Bocchiola, C., Merlin, L.
Published in Microelectronics (01.03.2006)
Published in Microelectronics (01.03.2006)
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Journal Article
Helium implantation in silicon: detailed experimental analysis of resistivity and lifetime profiles as a function of the implantation dose and energy
Daliento, S., Mele, L., Spirito, P., Gialanella, L., Romano, M., Limata, B.N., Carta, R., Bellemo, L.
Published in 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (2006)
Published in 2006 IEEE International Symposium on Power Semiconductor Devices and IC's (2006)
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Conference Proceeding
Electrical measurement of the lattice damage induced by -particle implantation in silicon
Bellemo, L., Carta, R., Daliento, S., Gialanella, L., Limata, B.N., Mele, L., Romano, M., Sanseverino, A., Spirito, P.
Published in Vacuum (01.05.2005)
Published in Vacuum (01.05.2005)
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Journal Article
An experimental analysis of localized lifetime and resistivity control by Helium
Daliento, S., Mele, L., Spirito, P., Gialanella, L., Romano, M., Limata, B.N., Carta, R., Bellemo, L.
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)
Published in Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005 (2005)
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Conference Proceeding