Resonance ionization spectroscopy for quantitative and sensitive surface and bulk measurements of impurities in II-VI materials
SEN, S, STANNARD, J. E, JOHNSON, S. M, ARLINGHAUS, H. F, BEKOV, G. I
Published in Journal of electronic materials (01.05.1995)
Published in Journal of electronic materials (01.05.1995)
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Conference Proceeding
Double-excited narrow autoionization states of ytterbium atom
Bekov, G.I., Vidolova-Angelova, E.P., Ivanov, L.N., Letokhov, V.S., Mishin, V.I.
Published in Optics communications (01.01.1980)
Published in Optics communications (01.01.1980)
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Journal Article