Rationale and development of a Security Assurance Index with application toward the development of a World Risk Index
Get full text
Conference Proceeding
Journal Article
Conductive bridging RAM (CBRAM): an emerging non-volatile memory technology scalable to sub 20nm
Kund, M., Beitel, G., Pinnow, C.-U., Rohr, T., Schumann, J., Symanczyk, R., Ufert, K.-D., Muller, G.
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)
Get full text
Conference Proceeding
Gain-of-Function Mutations in the Caenorhabditis elegans lin-1 ETS Gene Identify a C-Terminal Regulatory Domain Phosphorylated by ERK MAP Kinase
Jacobs, Dave, Beitel, Greg J, Clark, Scott G, Horvitz, H. Robert, Kornfeld, Kerry
Published in Genetics (Austin) (01.08.1998)
Published in Genetics (Austin) (01.08.1998)
Get full text
Journal Article
Chemical mechanical polishing of iridium and iridium oxide for damascene processes
MAINKA, G, BEITEL, G, SCHNABEL, R. F, SAENGER, A, DEHM, C
Published in Journal of the Electrochemical Society (01.10.2001)
Published in Journal of the Electrochemical Society (01.10.2001)
Get full text
Journal Article
A 32-Mb chain FeRAM with segment/stitch array architecture
Shiratake, S., Miyakawa, T., Takeuchi, Y., Ogiwara, R., Kamoshida, M., Hoya, K., Oikawa, K., Ozaki, T., Kunishima, I., Yamakawa, K., Sugimoto, S., Takashima, D., Joachim, H.-O., Rehm, N., Wohlfahrt, J., Nagel, N., Beitel, G., Jacob, M., Roehr, T.
Published in IEEE journal of solid-state circuits (01.11.2003)
Published in IEEE journal of solid-state circuits (01.11.2003)
Get full text
Journal Article
Tubulogenesis CLICs into Place
Paul, Sarah M., Beitel, Greg J.
Published in Science (American Association for the Advancement of Science) (19.12.2003)
Published in Science (American Association for the Advancement of Science) (19.12.2003)
Get full text
Journal Article
NEW RESULTS ON FATIGUE AND IMPRINT EFFECT
SCHORN, P. J., GERBER, P., BOETTGER, U., WASER, R., BEITEL, G., NAGEL, N., BRUCHHAUS, R.
Published in Integrated ferroelectrics (01.01.2005)
Published in Integrated ferroelectrics (01.01.2005)
Get full text
Journal Article
New highly scalable 3 dimensional chain FeRAM cell with vertical capacitor
Nagel, N., Bruchhaus, R., Hornik, K., Egger, U., Zhuang, H., Joachim, H.-O., Rohr, T., Beitel, G., Ozaki, T., Kunishima, I.
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Get full text
Conference Proceeding
Comparison of Materials for the Ferroelectric Thin Film to be Integrated into High Density FeRAMs
BRUCHHAUS, R., MOON, B.-K., HILLIGER, A., NAGEL, N., YAMADA, Y., ITOKAWA, H., YAMAKAWA, K., KUNISHIMA, I., BEITEL, G.
Published in Integrated ferroelectrics (01.01.2004)
Published in Integrated ferroelectrics (01.01.2004)
Get full text
Journal Article
A novel low-temperature (Ba, Sr)TiO3(BST) process with Ti/TiN barrier for Gbit DRAM applications
BEITEL, G, WENDT, H, NAGEL, N, GSCHWANDTNER, A, PAMLER, W, HÖNLEIN, W, DEHM, C, MAZURE, C, FRITSCH, E, WEINRICH, V, ENGELHARDT, M, HASLER, B, RÖHR, T, BERGMANN, R, SCHELER, U, MALEK, K.-H
Published in Microelectronic engineering (01.09.1999)
Published in Microelectronic engineering (01.09.1999)
Get full text
Conference Proceeding
Characteristics of an Oxygen Barrier Based on Bi-layered Ir
Moon, B. K., Arisumi, O., Bruchhaus, R., Tsutsumi, K., Itokawa, H., Hornik, K., Tsuchiya, T., Hilliger, A., Lian, J., Pinnow, C. U., Ozaki, T., Kunishima, I., Nagel, N., Yamakawa, K., Beitel, G.
Published in Integrated ferroelectrics (01.01.2003)
Published in Integrated ferroelectrics (01.01.2003)
Get full text
Journal Article
Oxygen Diffusion Barriers for High-Density FeRAMs
Moon, B. K., Pinnow, C. U., Imai, K., Arisumi, O., Itokawa, H., Hornik, K., Tsutsumi, K., Hilliger, A., Kunishima, I., Nagel, N., Yamakawa, K., Beitel, G.
Published in Integrated ferroelectrics (01.01.2002)
Published in Integrated ferroelectrics (01.01.2002)
Get full text
Journal Article