INELASTIC SCANNING CONFOCAL ELECTRON MICROSCOPY
NELLIST, PETER, DAVID, WANG, PENG, KIRKLAND, ANGUS, IAN, BEHAN, GAVIN, JOSEPH
Year of Publication 20.01.2011
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Year of Publication 20.01.2011
Patent
INELASTIC SCANNING CONFOCAL ELECTRON MICROSCOPY
NELLIST, PETER, DAVID, WANG, PENG, KIRKLAND, ANGUS, IAN, BEHAN, GAVIN, JOSEPH
Year of Publication 04.11.2010
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Year of Publication 04.11.2010
Patent