Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing
Amusan, O.A., Massengill, L.W., Baze, M.P., Bhuva, B.L., Witulski, A.F., DasGupta, S., Sternberg, A.L., Fleming, P.R., Heath, C.C., Alles, M.L.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop Designs
Baze, M.P., Hughlock, B., Wert, J., Tostenrude, J., Massengill, L., Amusan, O., Lacoe, R., Lilja, K., Johnson, M.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
HBD layout isolation techniques for multiple node charge collection mitigation
Black, J.D., Sternberg, A.L., Alles, M.L., Witulski, A.F., Bhuva, B.L., Massengill, L.W., Benedetto, J.M., Baze, M.P., Wert, J.L., Hubert, M.G.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry
Warren, K.M., Sternberg, A.L., Weller, R.A., Baze, M.P., Massengill, L.W., Reed, R.A., Mendenhall, M.H., Schrimpf, R.D.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Pulsed Laser Single-Event Effects in Highly Scaled CMOS Technologies in the Presence of Dense Metal Coverage
Balasubramanian, A., McMorrow, D., Nation, S.A., Bhuva, B.L., Reed, R.A., Massengill, L.W., Loveless, T.D., Amusan, O.A., Black, J.D., Melinger, J.S., Baze, M.P., Ferlet-Cavrois, V., Gaillardin, M., Schwank, J.R.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
A digital CMOS design technique for SEU hardening
Baze, M.P., Buchner, S.P., McMorrow, D.
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
Propagating SET Characterization Technique for Digital CMOS Libraries
Baze, M.P., Wert, J., Clement, J.W., Hubert, M.G., Witulski, A., Amusan, O.A., Massengill, L., McMorrow, D.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Dose dependence of interface traps in gate oxides at high levels of total dose
Baze, M.P., Plaag, R.E., Johnson, A.H.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
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Journal Article
Conference Proceeding
Single Event Upsets in a 130 nm Hardened Latch Design Due to Charge Sharing
Amusan, O.A., Stemberg, A.L., Witulski, A.F., Bhuva, B.L., Black, J.D., Baze, M.P., Massengill, L.W.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
Mitigation techniques for single event induced charge sharing in a 90 nm bulk CMOS process
Amusan, O.A., Massengill, L.W., Baze, M.P., Bhuva, B.L., Witulski, A.F., Black, J.D., Balasubramanian, A., Casey, M.C., Black, D.A., Ahlbin, J.R., Reed, R.A., McCurdy, M.W.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process
Amusan, O.A., Massengill, L.W., Baze, M.P., Bhuva, B.L., Witulski, A.F., Black, J.D., Balasubramanian, A., Casey, M.C., Black, D.A., Ahlbin, J.R., Reed, R.A., McCurdy, M.W.
Published in IEEE transactions on device and materials reliability (01.06.2009)
Published in IEEE transactions on device and materials reliability (01.06.2009)
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Magazine Article
Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA
O'Bryan, M.V., Poivey, C., Kniffin, S.D., Buchner, S.P., Ladbury, R.L., Oldham, T.R., Howard, J.W., LaBel, K.A., Sanders, A.B., Berg, M., Marshall, C.J., Marshall, P.W., Kim, H.S., Dung-Phan, A.M., Hawkins, D.K., Carts, M.A., Forney, J.D., Irwin, T., Seidleck, C.M., Cox, S.R., Friendlich, M., Flanigan, R.J., Petrick, D., Powell, W., Karsh, J., Baze, M.P.
Published in 2006 IEEE Radiation Effects Data Workshop (01.07.2006)
Published in 2006 IEEE Radiation Effects Data Workshop (01.07.2006)
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Conference Proceeding
An SEU analysis approach for error propagation in digital VLSI CMOS ASICs
Baze, M.P., Buchner, S., Bartholet, W.G., Dao, T.A.
Published in IEEE transactions on nuclear science (01.12.1995)
Published in IEEE transactions on nuclear science (01.12.1995)
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Journal Article
The effect of temperature on single-particle latchup
Johnston, A.H., Hughlock, B.W., Baze, M.P., Plaag, R.E.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1991)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1991)
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Journal Article
Conference Proceeding
A comparison of methods for total dose testing of bulk CMOS and CMOS/SOS devices
Baze, M.P., Plaag, R.E., Johnston, A.H.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1990)
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Journal Article
Conference Proceeding
Single event upset test structures for digital CMOS application specific integrated circuits
Baze, M.P., Bartholet, W.G., Braatz, J.C., Dao, T.A.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1993)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1993)
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Journal Article
Conference Proceeding
The effect of circuit topology on radiation-induced latchup
Johnston, A.H., Plaag, R.E., Baze, M.P.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) (01.12.1989)
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Journal Article
Conference Proceeding
A distributed model for radiation-induced latchup
Plaag, R.E., Baze, M.P., Johnston, A.H.
Published in IEEE transactions on nuclear science (01.12.1988)
Published in IEEE transactions on nuclear science (01.12.1988)
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Journal Article