Radiation Experiments on a 28 nm Single-Chip Many-Core Processor and SEU Error-Rate Prediction
Vargas, Vanessa, Ramos, Pablo, Ray, Vincent, Jalier, Camille, Stevens, Renaud, Dupont De Dinechin, Benoit, Baylac, Maud, Villa, Francesca, Rey, Solenne, Zergainoh, Nacer-Eddine, Mehaut, Jean-Francois, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode
Fabero, Juan Carlos, Mecha, Hortensia, Franco, Francisco J., Clemente, Juan Antonio, Korkian, Golnaz, Rey, Solenne, Cheymol, Benjamin, Baylac, Maud, Hubert, Guillaume, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.07.2020)
Published in IEEE transactions on nuclear science (01.07.2020)
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Journal Article
SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2-MeV Neutrons
Clemente, Juan Antonio, Hubert, Guillaume, Fraire, Juan, Franco, Francisco J., Villa, Francesca, Rey, Solenne, Baylac, Maud, Puchner, Helmut, Mecha, Hortensia, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
SEE error-rate evaluation of an application implemented in COTS Multi/Many-core processors
Ramos Vargas, Pablo Francisco, Vargas Vallejo, Vanessa Carolina, Baylac, Maud, Zergainoh, Nacer-Eddine, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
Status and prospects of the 60 GHz SEISM ion source
Andre, Thomas, Angot, Julien, Baylac, Maud, Dumont, Pierre Olivier, Lamy, Thierry, Sole, Patrick, Thuillier, Thomas, Debray, Francois, Izotov, Ivan, Skalyga, Vadim
Published in Journal of physics. Conference series (01.04.2022)
Published in Journal of physics. Conference series (01.04.2022)
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Journal Article
Sensitivity Characterization of a COTS 90-nm SRAM at Ultralow Bias Voltage
Clemente, Juan Antonio, Hubert, Guillaume, Franco, Francisco J., Villa, Francesca, Baylac, Maud, Mecha, Hortensia, Puchner, Helmut, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.08.2017)
Published in IEEE transactions on nuclear science (01.08.2017)
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Journal Article
Assessment of a Hardware-Implemented Machine Learning Technique Under Neutron Irradiation
Trindade, Matheus Garay, Coelho, Alexandre, Valadares, Carlos, Viera, Raphael A. C., Rey, Solenne, Cheymol, Benjamin, Baylac, Maud, Velazco, Raoul, Bastos, Rodrigo Possamai
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
Sensitivity Characterization of a COTS 90-nm SRAM at Ultra Low Bias Voltage
Clemente, Juan Antonio, HUBERT, Guillaume, Franco, Francisco J., Villa, Francesca, Baylac, Maud, MECHA, HORTENSIA, Puchner, Helmut, Velazco, Raoul
Published in IEEE transactions on nuclear science (2017)
Published in IEEE transactions on nuclear science (2017)
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Journal Article
Statistical Deviations From the Theoretical Only-SBU Model to Estimate MCU Rates in SRAMs
Franco, Francisco J., Clemente, Juan Antonio, Baylac, Maud, Rey, Solenne, Villa, Francesca, Mecha, Hortensia, Agapito, Juan A., Puchner, Helmut, Hubert, Guillaume, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.08.2017)
Published in IEEE transactions on nuclear science (01.08.2017)
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Journal Article
Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons
Ramos, Pablo, Vargas, Vanessa, Baylac, Maud, Villa, Francesca, Rey, Solenne, Clemente, Juan Antonio, Zergainoh, Nacer-Eddine, Mehaut, Jean-Francois, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.08.2016)
Published in IEEE transactions on nuclear science (01.08.2016)
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Journal Article
Prospect for a 60 GHz multicharged ECR ion source
Thuillier, T, Bondoux, D, Angot, J, Baylac, M, Froidefond, E, Jacob, J, Lamy, T, Leduc, A, Sole, P, Debray, F, Trophime, C, Skalyga, V, Izotov, I
Published in Review of scientific instruments (01.05.2018)
Published in Review of scientific instruments (01.05.2018)
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Journal Article
Radiation Experiments on a 28nm Single-Chip Many-core Processor and SEU error-rate prediction
Vargas, Vanessa, Ramos, Pablo, Ray, Vincent, Jalier, Camille, Stevens, Renaud, Dupont de Dinechin, Benoît, Baylac, Maud, Villa, Francesca, Rey, Solenne, Zergainoh, Nacer-Eddine, Méhaut, Jean-François, Velazco, Raoul
Published in IEEE transactions on nuclear science (2017)
Published in IEEE transactions on nuclear science (2017)
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Journal Article
Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs From MCUs
Clemente, Juan Antonio, Franco, Francisco J., Villa, Francesca, Baylac, Maud, Rey, Solenne, Mecha, Hortensia, Agapito, Juan A., Puchner, Helmut, Hubert, Guillaume, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.08.2016)
Published in IEEE transactions on nuclear science (01.08.2016)
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Journal Article
Final results of power conditioning of SPIRAL 2 couplers
Gómez Martínez, Y., Baylac, M., Boge, P., Cabanel, T., De Lamberterie, P., Giraud, J., Vezzu, F., Chatelet, F., Joly, C., Lesrel, J., Longuevergne, D., Martret, R., Olry, G., Renard, L., Bosland, P., Marchand, C., Maurice, L., Piquet, O., Bernaudin, P.-E., Ferdinand, R.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.10.2017)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.10.2017)
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Journal Article
Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons
Ramos, Pabo, Vargas, Vanessa, Baylac, Maud, Villa, Francesca, Rey, Solenne, Clemente, Juan Antonio, Zergainoh, Nacer-Eddine, Méhaut, Jean-François, Velazco, Raoul
Published in IEEE transactions on nuclear science (01.03.2016)
Published in IEEE transactions on nuclear science (01.03.2016)
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Journal Article
Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Neutrons
Clemente, J.A., Franco, F., Villa, Francesca, Baylac, Maud, Ramos Vargas, Pablo Francisco, Vargas Vallejo, Vanessa Carolina, Mecha, H., Agapito, J.-A., Velazco, Raoul
Published in IEEE transactions on nuclear science (2016)
Published in IEEE transactions on nuclear science (2016)
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Journal Article
Evidence of the Robustness of a COTS Soft-Error Free SRAM to Neutron Radiation
Velazco, R., Clemente, J. A., Hubert, G., Mansour, W., Palomar, C., Franco, F. J., Baylac, M., Rey, S., Rosetto, O., Villa, F.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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