Application of flexible flat panel display technology to wearable biomedical devices
Smith, J, Bawolek, E, Lee, Y.K, O'Brien, B, Marrs, M, Howard, E, Strnad, M, Blain Christen, J, Goryll, M
Published in Electronics letters (20.08.2015)
Published in Electronics letters (20.08.2015)
Get full text
Journal Article
Localization of Gate Bias Induced Threshold Voltage Degradation in a-Si:H TFTs
Shringarpure, R., Venugopal, S., Clark, L.T., Allee, D.R., Bawolek, E.
Published in IEEE electron device letters (01.01.2008)
Published in IEEE electron device letters (01.01.2008)
Get full text
Journal Article
Future flexible OLED displays for army applications
Forsythe, E.W., Shi, J., Liu, S., Morton, D.C., Loy, D., Yong Kyun Lee, Bell, C., Richards, M., Bawolek, E., Ageno, S., Moyer, C., Marrs, M., Kaminski, J., Colaneri, N., O'Rourke, S.M., Silvernail, J., Rajan, K., Ruiqing Ma, Hack, M., Brown, J.J.
Published in 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum electronics and Laser Science Conference (01.05.2009)
Published in 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum electronics and Laser Science Conference (01.05.2009)
Get full text
Conference Proceeding
Control of Threshold Voltage and Saturation Mobility Using Dual-Active-Layer Device Based on Amorphous Mixed Metal-Oxide-Semiconductor on Flexible Plastic Substrates
Marrs, M. A., Moyer, C. D., Bawolek, E. J., Cordova, R. J., Trujillo, J., Raupp, G. B., Vogt, B. D.
Published in IEEE transactions on electron devices (01.10.2011)
Published in IEEE transactions on electron devices (01.10.2011)
Get full text
Journal Article
Circuit-Level Impact of a-Si:H Thin-Film-Transistor Degradation Effects
Allee, D.R., Clark, L.T., Vogt, B.D., Shringarpure, R., Venugopal, S.M., Uppili, S.G., Kaftanoglu, K., Shivalingaiah, H., Li, Z.P., Ravindra Fernando, J.J., Bawolek, E.J., O'Rourke, S.M.
Published in IEEE transactions on electron devices (01.06.2009)
Published in IEEE transactions on electron devices (01.06.2009)
Get full text
Journal Article
Stability of IZO and a-Si:H TFTs Processed at Low Temperature (200 ^} )
Kaftanoglu, K, Venugopal, S M, Marrs, M, Dey, A, Bawolek, E J, Allee, D R, Loy, D
Published in Journal of display technology (01.06.2011)
Published in Journal of display technology (01.06.2011)
Get full text
Journal Article
Circuit Simulation of Threshold-Voltage Degradation in a-Si:H TFTs Fabricated at 175 @@u'@C
Shringarpure, R, Venugopal, S, Li, Zi, Clark, L T, Allee, D R, Bawolek, E, Toy, D
Published in IEEE transactions on electron devices (01.07.2007)
Published in IEEE transactions on electron devices (01.07.2007)
Get full text
Journal Article
Circuit Simulation of Threshold-Voltage Degradation in a-Si:H TFTs Fabricated at 175 super(ADG)C
Shringarpure, R, Venugopal, S, Li, Zi, Clark, L T, Allee, DR, Bawolek, E, Toy, D
Published in IEEE transactions on electron devices (01.01.2007)
Published in IEEE transactions on electron devices (01.01.2007)
Get full text
Journal Article
Circuit Simulation of Threshold-Voltage Degradation in a-Si:H TFTs Fabricated at 175 ^\hbox
Shringarpure, R., Venugopal, S., Zi Li, Clark, L.T., Allee, D.R., Bawolek, E., Toy, D.
Published in IEEE transactions on electron devices (01.07.2007)
Published in IEEE transactions on electron devices (01.07.2007)
Get full text
Journal Article