by Pershenkov, V.S., Bashin, A.Y., Zebrev, G.I., Avdeev, S.V., Belyakov, V.V., Ulimov, V.N., Emelianov, V.V.
Published in IEEE transactions on nuclear science (01.12.2002)

by Pershenkov, V.S., Slesarev, A.Y., Sogoyan, A.V., Belyakov, V.V., Kekukh, V.B., Bashin, A.Y., Ivashin, D.V., Motchkine, V.S., Ulimov, V.N., Emelianov, V.V.
Published in IEEE transactions on nuclear science (01.12.2001)

by Pershenkov, V.S., Avdeev, S.V., Tsimbalov, A.S., Levin, M.N., Belyakov, V.V., Ivashin, D.V., Slesarev, A.Y., Bashin, A.Y., Zebrev, G.I., Ulimov, V.N., Emelianov, V.V.
Published in Microelectronics and reliability (01.04.2002)

by Shvetzov-Shilovsky, I.N., Pershenkov, V.S., Belyakov, V.V., Zebrev, G.I., Bashin, A.Y., Ivashin, D.V.
Published in RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) (2001)