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Detection of Noise Level and Resonance Frequency Shifting Through of Principal Component Analysis (PCA) in Simulated Dataset of Band Excitation Scanning Probe Microscopy (BE-SPM)

Detection of Noise Level and Resonance Frequency Shifting Through of Principal Component Analysis (PCA) in Simulated Dataset of Band Excitation Scanning Probe Microscopy (BE-SPM)

by Rosero-Zambrano, Carlos Andres, Basante, Francy
Published in Microscopy and microanalysis (01.08.2018)

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Journal Article