An SEU analysis approach for error propagation in digital VLSI CMOS ASICs
Baze, M.P., Buchner, S., Bartholet, W.G., Dao, T.A.
Published in IEEE transactions on nuclear science (01.12.1995)
Published in IEEE transactions on nuclear science (01.12.1995)
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Journal Article
Single event upset test structures for digital CMOS application specific integrated circuits
Baze, M.P., Bartholet, W.G., Braatz, J.C., Dao, T.A.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1993)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1993)
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Journal Article
Conference Proceeding
Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model
Normand, E., Wert, J.L., Majewski, P.P., Oberg, D.L., Bartholet, W.G., Davis, S.K., Shoga, M., Wender, S.A., Gavron, A.
Published in Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) (1995)
Published in Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) (1995)
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Conference Proceeding